Tunneling barrier structure of and thin film Josephson junctions studied by Auger electron spectroscopy and X-ray photoelectron spectroscopy analysis

Lacquaniti, V.; Battistoni, C.; Paparazzo, E.; Cocito, M.; Palumbo, Stefano

doi:10.1016/0040-6090(82)90494-1

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2011

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Cited by 13 publications

(1 citation statement)

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“…In this case, however, technological problems related to deposition of continuous, ~10 nm thick, films from metals with low fusion temperature require solution. It is noteworthy that such alloys were used years ago in the first generation Josephson junctions (Lacquaniti et al, 1982). V or Ta could be interesting alternatives, but the best candidate for the realization of stable and robust turnstiles should obviously be Nb.…”

Section: Discussionmentioning

confidence: 99%

Current Status and Technological Limitations of Hybrid Superconducting-Normal Single Electron Transistors

Amato¹,

Enrico²

2011

Superconductivity - Theory and Applications

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Section: Discussionmentioning

confidence: 99%

Current Status and Technological Limitations of Hybrid Superconducting-Normal Single Electron Transistors

Amato¹,

Enrico²

2011

Superconductivity - Theory and Applications

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Surface quantitative analysis of CrO systems by XPS

Battistoni

Cossu

Mattogno

et al. 1983

Surface & Interface Analysis

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Quantitative surface analysis by XPS: A comparison among different quantitative approaches

Battistoni

Mattogno

Paparazzo

1985

Surface & Interface Analysis

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Atomic ratio determinations in a series of pure inorganic compounds have been derived from XPS peak intensity measurements taken by area via the so-called 'first principles model' (FPM) and the 'elemental sensitivity factors' (ESF) methods. The two methods show similar degrees of accuracy, with a typical error of about f10% when a set of experimental ESF is developed.A lower accuriicy, as expected, has been obtained when the literature ESF have been applied, Some discrepancy between the two approaches are evident when the kinetic energy separations of the XPS elemental peaks involved in the atomic ratio calculations is large. This aspect is discussed in the light of the instrumental responses which are of primary concern for the transferability of ESF results from one instrument to another.

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Tunneling barrier structure of and thin film Josephson junctions studied by Auger electron spectroscopy and X-ray photoelectron spectroscopy analysis

Cited by 13 publications

References 12 publications

Current Status and Technological Limitations of Hybrid Superconducting-Normal Single Electron Transistors

Current Status and Technological Limitations of Hybrid Superconducting-Normal Single Electron Transistors

Surface quantitative analysis of CrO systems by XPS

Quantitative surface analysis by XPS: A comparison among different quantitative approaches

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