“…For example, the obtained films could be characterized by using several techniques such as spectroscopic ellipsometry 1,2 , Raman Spectroscopy [3][4][5] ,electrochemical impedance spectroscopy [6][7][8] ,profilometer 9,10 , R u t h e r fo r d backscattering spectrometry [11][12][13][14] , scanning tunneling microscopy [15][16][17] , and atomic force microscopy [18][19][20] . These films exhibit excellent chemical, optical, physical and electrical properties.…”