2017
DOI: 10.13005/ojc/330466
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Study of Structural Properties of Ni3Pb2S2 Films

Abstract: In this work, X-ray diffraction technique was applied to determine the structure of nickel lead sulphide thin films prepared by chemical bath deposition. The X-ray diffraction patterns reflect that polycrystalline Ni 3 Pb 2 S 2 could be obtained using the method explained. The XRD data show that an increasing the deposition time from 7 to 30 hours resulted in increase in the number of peaks.

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Cited by 3 publications
(2 citation statements)
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“…The XPS spectra are acquired by irradiating a substance with a beam of the X-rays and thus kinetic energy and the number of the electrons have been measured, which have been escaped from the top 1 to 10 nm of the analyzed material. All elements had a specific elemental spectrum and the peaks derived from the mixture provide nearly the sum of the elemental peaks from the individual constituents [89].…”
Section: Characterizations Of Tmo Npsmentioning
confidence: 99%
“…The XPS spectra are acquired by irradiating a substance with a beam of the X-rays and thus kinetic energy and the number of the electrons have been measured, which have been escaped from the top 1 to 10 nm of the analyzed material. All elements had a specific elemental spectrum and the peaks derived from the mixture provide nearly the sum of the elemental peaks from the individual constituents [89].…”
Section: Characterizations Of Tmo Npsmentioning
confidence: 99%
“…Nanoporous and nanostructured materials and films have many useful modern applications in different adsorption, catalytic, electro-magnetic, microelectronics, colloid lithography, storage, optical, and biomedical devices [1][2][3][4][5]. The model of random sequential adsorption (RSA) is widely used to mimic properties of such materials.…”
Section: Introductionmentioning
confidence: 99%