Turn-on field distribution of field-emitting sites in carbon nanotube film: Study with luminescent image

Liu, Weihua; Zeng, Fang; Li, Xin; Chen, Zhu; He, Yongning

doi:10.1116/1.2817633

Cited by 12 publications

(4 citation statements)

References 20 publications

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“…A ring pattern with a diameter of ∼260 μm is visible on the defect site (i). Similar ring patterns have been observed in carbon nanotube field emission [12]- [14]. In addition, Fig.…”

Section: Methodssupporting

confidence: 66%

PolyMethyl Methacrylate Thin-Film-Based Field Emission Microscope

Sun

Jaffray

Chen

et al. 2012

IEEE Trans. Nanotechnology

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A field emission microscope (FEM) is a useful tool for investigating molecular surface structures. Conventional FEMs suffer from poor image contrast level and low sensitivities when low-energy electron beams are applied. In this article, a new anode material is employed to improve the FEM imaging performance. We demonstrate that the device has the capability of clearly capturing images of facet boundaries of crystal structures at the tip of a zinc oxide (ZnO) nanowire as defect sites on a Polymethyl methacrylate (PMMA) film that is exposed to electron beams. The clear image of facet boundaries has not been reported in conventional FEM images.Index Terms-Field emission microscope, polymethyl methacrylate (PMMA), zinc oxide.

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“…A ring pattern with a diameter of ∼260 μm is visible on the defect site (i). Similar ring patterns have been observed in carbon nanotube field emission [12]- [14]. In addition, Fig.…”

Section: Methodssupporting

confidence: 66%

PolyMethyl Methacrylate Thin-Film-Based Field Emission Microscope

Sun

Jaffray

Chen

et al. 2012

IEEE Trans. Nanotechnology

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“…Figure 5 shows the luminous pictures of the dendritic structure carbon nanotubes film cathode at different times and the same applied voltage, the emission current is about 50 μA. The luminescence picture of common CNTs film is shown in previous work [14]. Figure 5(a), which is the situation that just achieve this current, can be seen relatively light at lower left part, and relatively dark at the upper right corner.…”

Section: Resultsmentioning

confidence: 63%

Field Emission Properties of the Dendritic Carbon Nanotubes Film Embedded with ZnO Quantum Dots

Zuo

Liu

et al. 2011

Journal of Nanomaterials

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Response on the effects of individual differences of common carbon nanotubes on the field emission current stability and the luminescence uniformity of cathode film, a new type of cathode film made of dendritic carbon nanotubes embedded with Zinc oxide quantum dots is proposed. The film of dendritic carbon nanotubes was synthesized through high-temperature pyrolysis of iron phthalocyanine on a silicon substrate coated with zinc oxide nanoparticles. The dendritic structure looks like many small branches protrude from the main branches in SEM and TEM images, and both the branch and the trunk are embedded with Zinc oxide quantum dots. The turn-on field of the dendritic structure film is∼1.3 V/μm at a current of 2 μA, which is much lower than that of the common carbon nanotube film, and the emission current and the luminescence uniformity are better than that of the common one. The whole film emission uniformity has been improved because the multi-emission sites out from the dendritic structure carbon nanotubes cover up the failure and defects of the single emission site.

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“…Unfortunately, the possibilities to measure emission uniformity are limited. Cathodoluminescent phosphor screens are often used for this purpose [3,14,[23][24][25][26][27]. However, limited spatial resolution depending on the grain size [3,26], possible evaporation and burn-out of the luminescent layer [3,28], changes in the saturation behavior of p-doped FEAs due to the luminescence [29], and saturation effects especially over many orders of magnitude of emission currents [30] limit their applicability, particularly for quantified measurements.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays

Schels,

Herdl,

Hausladen

et al. 2023

Micromachines

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Field emitter arrays (FEAs) are a promising component for novel vacuum micro- and nanoelectronic devices, such as microwave power amplifiers or fast-switching X-ray sources. However, the interrelated mechanisms responsible for FEA degradation and failure are not fully understood. Therefore, we present a measurement method for quantitative observation of individual emission sites during integral operation using a low-cost, commercially available CMOS imaging sensor. The emission and degradation behavior of three differently doped FEAs is investigated in current-regulated operation. The measurements reveal that the limited current of the p-doped emitters leads to an activation of up to 55% of the individual tips in the array, while the activation of the n-type FEA stopped at around 30%. This enhanced activation results in a more continuous and uniform current distribution for the p-type FEA. An analysis of the individual emitter characteristics before and after a constant current measurement provides novel perspectives on degradation behavior. A burn-in process that trims the emitting tips to an integral current-specific ideal field enhancement factor is observed. In this process, blunt tips are sharpened while sharp tips are dulled, resulting in homogenization within the FEA. The methodology is described in detail, making it easily adaptable for other groups to apply in the further development of promising FEAs.

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Turn-on field distribution of field-emitting sites in carbon nanotube film: Study with luminescent image

Cited by 12 publications

References 20 publications

PolyMethyl Methacrylate Thin-Film-Based Field Emission Microscope

PolyMethyl Methacrylate Thin-Film-Based Field Emission Microscope

Field Emission Properties of the Dendritic Carbon Nanotubes Film Embedded with ZnO Quantum Dots

Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays

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