Abstract:It is well known that in Static Random Access Memory (SRAM) cells configured with single-ended bit lines, whenever a write operation is performed, a write failure may occur. In particular, it is relatively difficult to write a logical '1' to a cell if the cell currently stores a logical '0'. It is thus necessary to provide a method of resolving write failures in memory cells. In this paper, a novel seven-transistor (7T) two-port SRAM cell incorporating an assist circuit is proposed. Wherein, the assist circuit… Show more
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