1991, Proceedings. International Test Conference
DOI: 10.1109/test.1991.519762
|View full text |Cite
|
Sign up to set email alerts
|

Two-Stage Fault Location

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
11
0

Publication Types

Select...
4
3
1

Relationship

1
7

Authors

Journals

citations
Cited by 59 publications
(11 citation statements)
references
References 12 publications
0
11
0
Order By: Relevance
“…The first algorithm is based on the best-matched behavior and the second is based on fault dropping. For the best match algorithm [3], the number of matches between the faulty circuit and the circuit under diagnosis is kept for each fault. Faults are then sorted in descending order where the first ranked is the fault that resulted in the most number of matches.…”
Section: Dynamic Fault Locationmentioning
confidence: 99%
See 2 more Smart Citations
“…The first algorithm is based on the best-matched behavior and the second is based on fault dropping. For the best match algorithm [3], the number of matches between the faulty circuit and the circuit under diagnosis is kept for each fault. Faults are then sorted in descending order where the first ranked is the fault that resulted in the most number of matches.…”
Section: Dynamic Fault Locationmentioning
confidence: 99%
“…In general, fault dictionaries require large storage. To alleviate memory requirement compaction and compression techniques are used to reduce dictionary size [2,3]. Another technique recomputes the information stored in the dictionary when needed.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Motivated by this, alternatives to static diagnosis have been studied [1,2,5,6,16]. In dynamic diagnosis [14], no static fault dictionary is used.…”
Section: Introductionmentioning
confidence: 99%
“…In contrast, dynamic techniques diagnose the faulty behavior of the circuit while the test set is applied [1]. Integrated diagnosis techniques focus on using small amounts of pre-computed information and coupling this with efficient dynamic algorithms to perform fault location [2][3][4]. Integrated techniques aim to overcome the size limitations of static fault diagnosis and the run-time limitations of dynamic techniques by providing flexibility in choosing the amount of pre-computed information, which, in turn, has an effect on the performance at diagnosis time.…”
Section: Introductionmentioning
confidence: 99%