On adaptive diagnostic test generation

Gong, Yiming; Chakravarty, S.

doi:10.1109/iccad.1995.480010

Cited by 11 publications

(3 citation statements)

References 14 publications

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“…During debug and during diagnosis of first silicon, there exists an efficient alternative to precomputed fault dictionaries in so-called adaptive diagnosis [24]. Here, we use faulty and faultfree responses of the device under diagnosis (DUD) in order to guide the automatic generation of new patterns for increasing the resolution.…”

Section: Fault Dictionaries Vs Adaptive Diagnosismentioning

confidence: 99%

Adaptive Debug and Diagnosis without Fault Dictionaries

Holst¹,

Wunderlich²

2008

2008 13th European Test Symposium

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Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the presilicon development process. For recent process technologies, defect mechanisms are increasingly complex, and continuous efforts are made to model these defects by using sophisticated fault models. Traditional static approaches for debug and diagnosis with a simplified fault model are more and more limited.In this paper, a method is presented, which identifies possible faulty regions in a combinational circuit, based on its input/output behavior and independent of a fault model. The new adaptive, statistical approach combines a flexible and powerful effect-cause pattern analysis algorithm with highresolution ATPG. We show the effectiveness of the approach through experiments with benchmark and industrial circuits.

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Section: Fault Dictionaries Vs Adaptive Diagnosismentioning

confidence: 99%

Adaptive Debug and Diagnosis without Fault Dictionaries

Holst¹,

Wunderlich²

2008

2008 13th European Test Symposium

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“…Recently, several methods have been proposed for diagnosing realistic faults by using I DDQ information in addition to logic value information [9], [12], [14]. There also exist methods that use only I DDQ information [11], [13]. Furthermore, diagnostic test generation methods [11], [14] as well as methods for simulating realistic faults [6], [14] have also been proposed to improve diagnostic resolution.…”

Section: Introductionmentioning

confidence: 99%

“…Although they are useful, previous I DDQ -based fault di-Copyright c 2005 The Institute of Electronics, Information and Communication Engineers agnosis methods suffer from the limitation that there is only one I DDQ observation point if all gates in a circuit are connected to the same power supply. Diagnostic resolution obtained with only one I DDQ measurement point, even if logic value information and diagnostic vectors are used, may still be unsatisfactory [11]. This paper proposes a novel approach to improving the I DDQ -based diagnosability of a CMOS circuit.…”

Section: Introductionmentioning

confidence: 99%

On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies

Wen

Kajihara

Tamamoto

et al. 2005

IEICE Transactions on Information and Systems

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This paper presents a novel approach to improving the I DDQ-based diagnosability of a CMOS circuit by dividing the circuit into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple I DDQ measurement points, resulting in improved I DDQ-based diagnosability. The paper formalizes the problem of partitioning a circuit for this purpose and proposes optimal and heuristic based solutions. The effectiveness of the proposed approach is demonstrated through experimental results.

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A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals

Rad

Plusquellic

2009

J Electron Test

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On adaptive diagnostic test generation

Cited by 11 publications

References 14 publications

Adaptive Debug and Diagnosis without Fault Dictionaries

Adaptive Debug and Diagnosis without Fault Dictionaries

On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies

A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals

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