Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

Hasar, Uğur Cem; Barroso, Joaquim J.; Kaya, Yunus; Ertuğrul, Mehmet; Bute, Musa; Catalá-Civera, J.M.

doi:10.1007/s00339-014-8303-9

Cited by 13 publications

(5 citation statements)

References 56 publications

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“…r1 jmπ e jφ1 1 − r2 r1 e ∆φ odd harmonics 0 even harmonics (14) where, ∆φ = φ 1 − φ 2 is the phase difference between the contributing reflection coefficients. Note that, arising from the Fourier properties of square waves, only the odd and zeroth harmonic components are found to survive in the reflected fields.…”

Section: A Background: Time-modulated Waveguidesmentioning

confidence: 99%

“…For example, some artifacts arise in the extracted material parameters at frequencies near halfwavelength resonances for low loss material [13]. On the other hand, very lossy materials may trap and dissipate the impinging wave, which results in weak and low SNR transmitted signal [14], degrading the extracted material parameters. Beside the transmission/reflection techniques, the reflection-only methods have been also reported to extract the MUT parameters by performing only reflection measurements.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Time-modulated Measurements: Material Characterization Based on Scalar Reflection Data

Ghasemi,

Rajabalipanah,

Tayarani

et al. 2020

Preprint

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This paper explores the time-modulated waveguide setups for unique and accurate permittivity and permeability extraction of lossy dispersive samples with phase-less measurements. We theoretically demonstrate that when the position of the short-circuit termination is dynamically modulated in a predefined way, the phase information of the reflection S-parameter manifests itself into the amplitude level of the emerging harmonics. Being insensitive to the calibration plane shifts and phase uncertainties in reflection measurements while bypassing a priori knowledge about the material under test (MUT) and also the transmission coefficient, can be enumerated as the main advantages of the proposed time-modulated retrieval scheme. Moreover, the presented reconstruction algorithm offers a simple post-processing step to facilitate fast computations of εr and µr. Several illustrative examples at X-band frequencies have been presented to numerically verify the validity of the proposed approach for some applicable and practical types of homogeneous materials. Two possible realization and measurement configurations are suggested and discussed based on mechanical actuation and electrical phase control. We have also performed an uncertainty analysis to examine how the realization tolerances can affect the accuracy of results. By involving the temporal dimension, the proposed strategy takes a great step forwards in phase-less reconstruction of the electromagnetic parameters.

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Section: A Background: Time-modulated Waveguidesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Time-modulated Measurements: Material Characterization Based on Scalar Reflection Data

Ghasemi,

Rajabalipanah,

Tayarani

et al. 2020

Preprint

View full text Add to dashboard Cite

show abstract

“…In contrast, the one-port material measurement method, which uses the reflection property of an MUT, can determine only one of the two material parameters of the MUT [15]. To obtain both material parameters from a one-port material measurement, one would need two independent reflection measurements with, for example, two MUTs of different thickness [16] or one MUT placed at different positions [5] in a transmission line.…”

Section: Introductionmentioning

confidence: 99%

Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

Kang

2022

J. Electromagn. Eng. Sci

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The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.

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“…For example, some artifacts arise in extracted material parameters at frequencies near half‐wavelength resonances for low‐loss materials. [ 16 ] Moreover, very lossy materials may trap and dissipate the impinging wave, which results in a transmitted signal with low signal‐to‐noise ratio, [ 17 ] degrading extracted material parameters. In addition to transmission/reflection techniques, reflection‐only methods have been reported to extract the MUT parameters by only performing reflection measurements.…”

Section: Introductionmentioning

confidence: 99%

Time‐Modulated Metasurface‐Assisted Measurements

Ghasemi

Rajabalipanah

Tayarani

et al. 2021

Advanced Optical Materials

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This paper explores time‐modulated metasurface‐assisted waveguide setups for the unique and accurate permittivity and permeability extraction of lossy dispersive samples with phase‐less measurements. It is theoretically demonstrated that when the position of the short‐circuit termination is dynamically modulated in a predefined way, the phase information of the reflection S‐parameter manifests itself into the amplitude level of the emerging harmonics. Being insensitive to the calibration plane shifts and phase uncertainties in reflection measurements while bypassing a priori knowledge about the material under test (MUT) and also the transmission information, can be regarded as the main advantages of the proposed time‐modulated material characterization approach. Using a simple post‐processing step, several illustrative examples are presented to numerically verify the validity of the proposed approach for some applicable and practical types of homogeneous materials. Two possible realization schemes based on mechanical actuation and electrical phase control are comprehensively discussed. An uncertainty analysis to examine how realization tolerances can affect the accuracy of results is also performed. The effectiveness of the proposed method is further experimentally demonstrated using a programmable phase‐agile metasurface. By involving the temporal dimension, the proposed strategy takes a great step forward in the phase‐less reconstruction of electromagnetic parameters.

show abstract

Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

Cited by 13 publications

References 56 publications

Time-modulated Measurements: Material Characterization Based on Scalar Reflection Data

Time-modulated Measurements: Material Characterization Based on Scalar Reflection Data

Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

Time‐Modulated Metasurface‐Assisted Measurements

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