Two-wave-plate compensator method for full-field retardation measurements

Montarou, Carole C.; Gaylord, Thomas K.; Bachim, Brent L.; Dachevski, Alexei I.; Agarwal, Akhil

doi:10.1364/ao.45.000271

Cited by 21 publications

(13 citation statements)

References 46 publications

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“…The literature contains numerous examples of techniques that have been developed to characterize optical anisotropy (Inoué, 2007; Shribak and Oldenbourg, 2003; Xia et al, in press). Some require polarization‐analyzing optics, including polarizers, rotators, and retarders (Hartshorne and Stuart, 1970; Hutsel et al, 2009; Montarou et al, 2006) or other polarimetric methods (Oka and Kaneko, 2003; Oldenbourg and Mei, 1995; Shribak and Oldenbourg, 2003). Others involve more complex interferometric methods, whereby the retardation is determined from an intensity pattern obtained through the interference of two beams with a beam passing through the specimen (Colomb et al, 2005; El‐Diasty, 1999; Hitzenberger et al, 2001).…”

Section: Introductionmentioning

confidence: 99%

Orientation independent retardation imaging using quantitative polarized phase microscopy

Dragomir

Roberts

2012

Microscopy Res & Technique

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Simultaneous optical phase and retardation measurement of a birefringent specimen is demonstrated independently of a priori knowledge of the optic axis orientation. The two-dimensional retardation distribution in both magnitude and angle of the fast axis orientation is uniquely determined from transverse phase images recorded with a bright field transmission microscope using light polarized at a minimum of three different polarization orientations. This approach opens a new possibility for stain-free phase and orientation-independent retardation characterization of samples using only one polarizer without needing other additional optical elements traditionally used in polarimetric measurements.

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Section: Introductionmentioning

confidence: 99%

Orientation independent retardation imaging using quantitative polarized phase microscopy

Dragomir

Roberts

2012

Microscopy Res & Technique

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“…They are the phase modulation method [6,7], the intensity determination method [8,9], and the compensator-based method [10,11]. The phase modulation method employs the phase modulator to measure the retardation.…”

Section: Introductionmentioning

confidence: 99%

Real-time Measurement of Full Field Retardation Near Quarter Wavelength

Liu¹,

Zeng²,

Qiao³

et al. 2012

Journal of the Optical Society of Korea

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A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is 1.5° and 0.4°. The validity of the method is verified.

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“…There is considerable interest in spatially quantifying the parameters describing optical anisotropy [3][4][5][6][7]. Many living biological specimens [4][5][6][7][8] as well as photonic devices [8][9][10] exhibit low-level birefringence eventually induced by stresses.…”

Section: Introductionmentioning

confidence: 99%

“…Many living biological specimens [4][5][6][7][8] as well as photonic devices [8][9][10] exhibit low-level birefringence eventually induced by stresses. For instance, the determination of stresses in transparent thin plates (or films) plays an important role in optoelectronic technologies.…”

Section: Introductionmentioning

confidence: 99%

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Imaging polarimetry for the determination of stress constraint in transparent solids

Richert

Orlik

Martino

2010

EPJ Web of Conferences

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Abstract. Using a Mueller matrix polarimeter based on liquid crystal cells [1] and the forward polar decomposition [2], we study the evolution of the birefringence property induced by an increasing compression of a Plexiglas sample. We measure the 2D distribution of the relative retardation į, the azimuth angle Į and the ellipticity angle İ of the sample. A noticeable advantage of such method is the possibility to map the stressinduced birefringence even if the material used for the reflexion implies partial depolarization of the scattered field. More generally, this method will be particularly useful in experimental situations where the light beam undergoes depolarization and/or dichroïsm in addition to birefringence effects because classical birefringence measurement methods are not able to perform an efficient discrimination between these 3 effects. Our experiment shows that the Plexiglas sample under investigation exhibits some weak stress-induced elliptic birefringence. According to simple numerical simulations, this observation is explained by the use of a bi-static illumination/detection configuration.

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Two-wave-plate compensator method for full-field retardation measurements

Cited by 21 publications

References 46 publications

Orientation independent retardation imaging using quantitative polarized phase microscopy

Orientation independent retardation imaging using quantitative polarized phase microscopy

Real-time Measurement of Full Field Retardation Near Quarter Wavelength

Imaging polarimetry for the determination of stress constraint in transparent solids

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