The two-wave-plate compensator (TWC) technique is introduced for single-point retardation measurements. The TWC method uses a known wave plate together with a wave plate of unknown retardation and produces a linearly polarized output that allows a null of intensity to be detected. The TWC method is compared both theoretically and experimentally with the existing Brace-Köhler and Sénarmont methods. The resolution of the TWC is shown to be 0.02 nm. TWC enables the measurement of a sample retardation with as little as 0.13% error and thus is more accurate than either the Brace-Kohler or the Sénarmont method.

The two-wave-plate compensator (TWC) method is expanded for full-field retardation measurements by use of a polarization microscope. The sample image is projected onto a CCD camera connected to a computer, allowing the retardation to be measured at all pixels. The retardation accuracy of this implementation of the TWC is evaluated to be 0.06 nm. The method is applied to polarization-maintaining fibers and long-period fiber gratings. The measured retardation is in good agreement with the crossed-polarizer images of the fibers. The method achieves a spatial resolution of 0.45 microm and a retardation resolution of 0.07 nm. The full-field TWC method can thus be a useful tool for characterizing and monitoring the fabrication of optical devices.

An exact analysis of the working parameters of a modified Wollaston prism is presented. Parameters include the output splitting angle, the retardation, and the location of the plane of the interference fringes (plane of apparent splitting). Results are presented for the entire range of optical axis inclinations and wedge angles. Approximate expressions from the literature are evaluated. An angle of incidence that causes the plane of the interference fringes to be perpendicular to the axis of the optical system is found for each configuration analyzed. This is then applied to the design of modified Wollaston prisms for Nomarski differential interference contrast microscopy.

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A colorimetry-based retardation measurement (CBRM) method is presented. The specimen, between crossed polarizers, is illuminated with a white-light source. The retardation that is due to the birefringence of the specimen produces a white-light interference color. The x, y chromaticity coordinates of the color produced are measured with a spectrophotometer. The resulting x, y values are compared with a retardation x, y database that we obtained by measuring the retardation with an accurate Senarmont compensator and the x, y chromaticity values along the length of a 0-4-order quartz wedge. The technique was validated by the measurement of a variety of retardation plates. The retardation accuracy (mean error) of the CBRM method is shown to be 3.6 nm. The resolution is +/-0.2 nm, and the measurement range is 5-2150 nm. The method substitutes for a polariscope and eliminates errors associated with quarter-wave plates. The CBRM method does not utilize any moving parts and thus is fast and can be automated.