TXRF determination of indium at ultra trace levels in heavy water samples using In Kα as analytical line and continuum excitation

Dhara, Sangita; Kumar, Sachin; Misra, Nilanjal

doi:10.1007/s10967-015-4180-8

Cited by 9 publications

(2 citation statements)

References 12 publications

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“…Industrial samples containing high salt content as well as nuclear materials consisting of uranium and heavy water are accessible for TXRF analysis as well. In some cases sample can be analyzed directly, but mostly a sample pretreatment step involving acid digestion, extraction or separation is involved [18,[81][82][83][84]. In the pharmaceutical industry TXRF has been applied successfully to determine metal impurities in active pharmaceutical ingredients (APIs) using a variety of organic solvents including methanol and also nitric acid digestion as sample preparation steps.…”

Section: Other Applicationsmentioning

confidence: 99%

Total reflection X-ray fluorescence

Schmeling

2019

Physical Sciences Reviews

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Abstract Total reflection X-ray fluorescence (TXRF) spectrometry is a non-destructive and surface sensitive multi-element analytical method based on energy dispersive X-ray fluorescence spectrometry with detection limits in the lower picogram range. It utilizes the total reflection of the primary X-ray beam at or below the critical angle of incidence. At this angle, the fluorescence intensity is substantially enhanced for samples present as small granular residue or as thin homogenous layer deposited at the surface of a thick substrate. Generally, two types of application exist: micro- and trace-analysis as well as surface and thin-layer analysis. For micro- and trace-analysis, a small amount of the solid or liquid sample is deposited on an optically flat substrate, typically quartz or polycarbonate. The dried residue is analyzed at a fixed angle setting slightly below the critical angle. Quantification is carried out by means of internal standardization. For surface and thin-layer analysis, the surface of an optically flat substrate is scanned. Variations of the incident angle of the primary X-ray beam provide information about the type and sometimes also the amount of material present at or slightly below the surface of the substrate. Major fields of application are environmental samples, biological tissues, objects of cultural heritage, semiconductors and thin-layered materials and films.

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Section: Other Applicationsmentioning

confidence: 99%

Total reflection X-ray fluorescence

Schmeling

2019

Physical Sciences Reviews

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“…With 10-20 mL of sample volume, extrapolated detection limits in the ng g À1 range were achieved in terms of concentration. Dhara et al 75 presented an interesting method for the determination of In concentration levels >1 ng mL À1 in heavy water samples. Excitation was by means of a tungsten target X-ray tube coupled to a multilayer primary reector with a bandpass covering the range 25-35 keV.…”

Section: Txrf and Related Techniquesmentioning

confidence: 99%