2018
DOI: 10.1016/j.vlsi.2018.03.006
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Ultra low power-high stability, positive feedback controlled (PFC) 10T SRAM cell for look up table (LUT) design

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Cited by 20 publications
(25 citation statements)
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“…The proposed D 2 LP10T cell is efficient for the low power and energy, which is very productive for the requirement of the LiFi application. 23 ; B, PFC10T 12 ; C, PPN10T 24 ; D, PNN10T 25 ; E, ST2 26…”
Section: Proposed D Lp10t Sram Cellmentioning
confidence: 99%
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“…The proposed D 2 LP10T cell is efficient for the low power and energy, which is very productive for the requirement of the LiFi application. 23 ; B, PFC10T 12 ; C, PPN10T 24 ; D, PNN10T 25 ; E, ST2 26…”
Section: Proposed D Lp10t Sram Cellmentioning
confidence: 99%
“…Moreover, the 6T cell also has the problem of half select issue, read/write conflict of stored data in storage node voltage. 6,7 To resolve all conditions, various design strategies have been suggested in the form of art circuits in the literature, such as read decoupling technique to isolate the read path from the storage node, 8,9 feedback cutting approach is used in the cross-coupled inverter to enhance the stability, [10][11][12] single-ended approach is used to enhance the read stability to a great extent, 13,14 stacking effect is used in the cross-coupled inverter or in the access path to reduce the leakage power dissipation, 15,16 write assist circuitry is used to reduce the write power and enhance the write stability, 17,18 half-select disturb-free strategy is used in an array to resolve the half select issue, 11,17 and the FinFET is also used as an alternative device to conventional planar-bulk MOSFET to reduce the V th variation. 19,20 The researchers have also worked in the subthreshold region with greater stability and robust architecture.…”
mentioning
confidence: 99%
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“…The proposed SRAM cell is adopted to design a look up table for 6-inputs of FPGA and a 2kb SRAM macroblock. They achieved superior results in terms of write and read static noise margins; and less leakage power dissipation [10]. Y. Wang, et al proposed hypotheses for the underlying causes and validate power variations in processors based upon specifically governed environmental factors.…”
Section: Introductionmentioning
confidence: 99%
“…5 During the process of attempting to improve transistor performance, the double-gated transistors showed good potential towards improving the switching strength and hence the performance of the transistor. [6][7][8][9][10][11] Despite this improvement, the new structure introduced different types of dimensional variability. Thus, process variation continued to be one of the main challenges for design reliability.…”
Section: Introductionmentioning
confidence: 99%