“…Variation of the wavelength, i.e., absorption length within the sample, indicates that the c-Si:H film exhibits depth dependent electronic properties which are manifest in the measured THz transmission transients. Interestingly, the dynamics that we observe within the first picoseconds after excitation was not observed in earlier pump-probe measurements utilizing visible and near-IR pulses on c-Si:H. 6 While differences in the measured samples cannot be excluded as a reason for the differences, pump-probe measurements with visible/near-IR pulses rely on electronic excitation of carriers from any given state in order to induce an absorption change. Hence, it is not expected a priori that it is possible to distinguish between carriers at the conduction-band minimum from carriers in trap states in the band gap.…”