Ultrafast secondary emission X-ray imaging detectors: A possible application to TRD

Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

“…39 Additionally, the energies of X-ray induced secondary electrons are mostly below 50 eV. 40 Such low-energy electrons are able to induce damage in graphene, resulting in the formation of defects. 41,42 The defects such as defective localized aromatic sp 2 (a) C 1s core-level spectra of GO film on ITO substrate taken at a continuous exposure to soft X-ray irradiation after 1, 15, and 30 min, respectively, where the C−C peak is for the C 1s sp 2 structure, C− O peak for epoxy/hydroxyl function group, CO peak for carbonyl groups, and C-defect peak for defect formation.…”

“…50 The main secondary electrons have a broad-band energy under 50 eV. 40 The low-energy electrons can activate the ionization and DEA to induce the dissociation of C−O bonds. 50 This is the way that EHGs and carbonyl groups are dissociated by the secondary electrons.…”

“…Under X-ray exposure, the carbon sp 2 structure of graphene is unstable . Additionally, the energies of X-ray induced secondary electrons are mostly below 50 eV . Such low-energy electrons are able to induce damage in graphene, resulting in the formation of defects. , The defects such as defective localized aromatic sp 2 and C 1s sp 3 defect have binding energies close to 285.7–286.3 eV. ,, Therefore, an additional C-defect peak component at 286.1 eV with wide fwhm of 1.5 eV was included to the C 1s core-level spectrum of GO for appropriate fitting. , The C-defect peak increases with X-ray exposure.…”

“…The DEA is the key phenomenon in the fragmentation of DNA by ionizing radiation . The main secondary electrons have a broad-band energy under 50 eV . The low-energy electrons can activate the ionization and DEA to induce the dissociation of C–O bonds .…”