UltraForm finishing process for optical materials

Fess, Edward; Schoen, John M.; Bechtold, Mike; Mohring, David; Bouvier, Christophe

doi:10.1117/12.623833

Cited by 5 publications

(4 citation statements)

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“…Before and after measurement of the polished workpiece surface enables influence function quantification. [37][38][39] Typically an average of four readings is taken in magnetorheological finishing. Figure 3 illustrates the results of the determination procedure of an example influence function in magnetorheological finishing (described later).…”

Section: Polishing Tool Removal Characteristic -Influence Functionmentioning

confidence: 99%

“…33,34 The longer the contact time duration, the more material is removed. [35][36][37] The dwell time of the polishing tool for each particular position on the workpiece surface is calculated in terms of the surface-error profile and the material removal characteristic of the polishing tool. This results in the polishing tool velocity profile.…”

Section: Computer-controlled Polishingmentioning

confidence: 99%

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Advanced techniques for computer-controlled polishing

et al. 2008

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Computer-controlled polishing has introduced determinism into the finishing of high-quality surfaces, for example those used as optical interfaces. Computer-controlled polishing may overcome many of the disadvantages of traditional polishing techniques. The polishing procedure is computed in terms of the surface error-profile and the material removal characteristic of the polishing tool, the influence function. Determinism and predictability not only enable more economical manufacture but also facilitate considerably increased processing accuracy. However, there are several disadvantages that serve to limit the capabilities of computer-controlled polishing, many of these are considered to be issues associated with determination of the influence function. Magnetorheological finishing has been investigated and various new techniques and approaches that dramatically enhance the potential as well as the economics of computer-controlled polishing have been developed and verified experimentally. Recent developments and advancements in computer-controlled polishing are discussed. The generic results of this research may be used in a wide variety of alternative applications in which controlled material removal is employed to achieve a desired surface specification, ranging from surface treatment processes in technical disciplines, to manipulation of biological surface textures in medical technologies.

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Section: Polishing Tool Removal Characteristic -Influence Functionmentioning

confidence: 99%

Section: Computer-controlled Polishingmentioning

confidence: 99%

Advanced techniques for computer-controlled polishing

et al. 2008

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“…Within the field of CCP, the polishing tool removal characteristic is referred to as the influence function [11] or removal function [12]. The influence function is commonly saved as a data array, which represents the distribution of the removal rate across the size of the polishing tool.…”

Section: Polishing Tool Removal Characteristic-influence Functionmentioning

confidence: 99%

Filter algorithm for influence functions in the computer controlled polishing of high-quality optical lenses

Schinhaerl

Rascher

Stamp

et al. 2007

International Journal of Machine Tools and Manufacture

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“…1,2 This in turn has spurred the need for improved metrology solutions for freeform surfaces. 3 To address this need, ASE Optics, LLC has developed a multi-point non-contact optical probe that uses low-coherence dual wavelength interferometry to measure both the position and orientation of a surface with respect to the probe.…”

Section: Introductionmentioning

confidence: 99%

The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer

Cotton¹,

Ditchman²,

Burdick³

et al. 2012

SPIE Proceedings

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A highly efficient method for splitting the probe beam produced by a scanning low-coherence distance-measuring interferometer (SLCDI) is presented. The SLCDI is used to measure thicknesses of materials with thicknesses in the range of 12 microns-50 mm, with a repeatability of 0.1 microns. The measurements are made optically with a beam with a wavelength of 1.3 microns. The SLCDI is also capable of simultaneous measurement of a stack of multiple films. Splitting of the beam from the SLCDI probe to create a multi-point probe allows for multiple, simultaneous measurements to be made at a surface. An advantage of this capability is that it provides the ability of to measure the surface normal at each of the surfaces that are under test. The operation of the SLCDI will be described along with how the operation impacts the requirements for the multi-point probe system. The requirements are discussed from the standpoint of the coherence length of the SLCDI source and the operational usage of the probe. The splitting is achieved through the use of polarization components. The function and performance of the resulting probe is also discussed.

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UltraForm finishing process for optical materials

Cited by 5 publications

References 0 publications

Advanced techniques for computer-controlled polishing

Advanced techniques for computer-controlled polishing

Filter algorithm for influence functions in the computer controlled polishing of high-quality optical lenses

The design of a multi-point probe for a scanning low-coherence distance-measuring interferometer

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