2009
DOI: 10.1016/j.proche.2009.07.358
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Ultrahigh-density trench capacitors in silicon and their application to integrated DC-DC conversion

Abstract: This paper addresses silicon-based integration of passive components applied to 3D integration with dies of other technologies within one package. Particularly, the development of high-density trench capacitors has enabled the realization of small-formfactor DC-DC converters. As illustration, an integrated inductive DC-DC converter based on flip-chipping a 65-nm CMOS active die on a PICS™ (Passive-Integration Connecting Substrate) passive die is described. The PICS die includes high-density (80 nF/mm 2 ) integ… Show more

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Cited by 15 publications
(10 citation statements)
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“…The latter are based on RIE-etched arrays of high aspect ratio macro pores. Typical depth extension of those pores into the silicon substrate would be in the order of ~30 to 60µm for the different PICS technologies [1][2]. Compared to 2D silicon integrated capacitor technologies (like MOS or MIM), one foresee that surface deployed by the PICS 3D component into the substrate is rather large, thus potentially leading to critical parasitic capacitance.…”
Section: D-pics Technology Descriptionmentioning
confidence: 99%
“…The latter are based on RIE-etched arrays of high aspect ratio macro pores. Typical depth extension of those pores into the silicon substrate would be in the order of ~30 to 60µm for the different PICS technologies [1][2]. Compared to 2D silicon integrated capacitor technologies (like MOS or MIM), one foresee that surface deployed by the PICS 3D component into the substrate is rather large, thus potentially leading to critical parasitic capacitance.…”
Section: D-pics Technology Descriptionmentioning
confidence: 99%
“…Bergveld, H. J., Nowak, K., Karadi, R., Iochem, S., Ferreira, J., Ledain, S., ... Pommier, M. (2009). A 65-nm-CMOS 100-MHz 87%-efficient DC-DC down converter based on dual-die system-in-package integration.…”
Section: Citation For Published Version (Apa)mentioning
confidence: 99%
“…The passive die was designed in the Passive-Integration Connective Substrate (PICS) process [13]- [18]. The PICS process was developed in NXP Semiconductors to integrate passive components such as high-Q inductors, resistors, accurate MIM capacitors, and, in particular, high-density (~30 nF/mm 2 ) MOS 'trench' capacitors for decoupling and filtering.…”
Section: A Passive-integration Technologymentioning
confidence: 99%
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“…different types of capacitors, such as trench capacitors with a very high density, can be performed on a silicon wafer (Roozeboom et al 2009). Taking advantage of large inner surface area of the trenches, the area can be increased more than 50 times and capacitance density can be increased up to 70 times more than the planar capacitor (Momose et al 2011).…”
mentioning
confidence: 99%