Ultrahigh-figure-of-merit refractive index sensor based on the Rayleigh anomaly resonance

Rahimi, L.; Askari, Ali

doi:10.1364/ao.405129

Cited by 10 publications

(6 citation statements)

References 34 publications

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“…This value is an order of magnitude larger than that of the RA in ref. [19], and is about twice of the highest quality factor of the reported RA in the near infrared regime [18]. Besides the extremely narrow RA dip, a relatively wider reflectance dip of Lorentzian profile due to the excitation of the SPP mode locates at λ SPP = 764.8 nm.…”

Section: Spectrum and Near Fieldsmentioning

confidence: 80%

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Mirror-backed dielectric metasurface sensor with ultrahigh figure of merit based on super-narrow Rayleigh anomaly

Wang,

Xiong,

Tian

et al. 2021

Preprint

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Plasmonic nanostructures with large local field enhancement have been extensively investigated for sensing applications. However, the quality factor and thus the sensing figure of merit are limited due to relatively high ohmic loss. Here we propose a novel plasmonic sensor with ultrahigh figure of merit based on super-narrow Rayleigh anomaly (RA) in a mirror-backed dielectric metasurface. Simulation results show that the RA in such a metasurface can have a super-high quality factor of 16000 in the visible regime, which is an order of magnitude larger than the highest value of reported plasmonic nanostructures. We attribute this striking performance to the enhanced electric fields far away from the metal film. The super-high quality factor and the greatly enhanced field confined to the superstrate region make the mirror-backed dielectric metasurface an ideal platform for sensing. We show that the figure of merit of this RA-based metasurface sensor can be as high as 15930/RIU. Additionally, we reveal that RA-based plasmonic sensors share some typical characteristics, providing guidance for the structure design. We expect this work advance the development of high-performance plasmonic metasurface sensors.

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Section: Spectrum and Near Fieldsmentioning

confidence: 80%

“…Su et al [17] proposed a novel grating composed of an 8-layer Au/Al 2 O 3 stack and obtained narrower RA compared with the gold grating. By optimizing a metallic grating, Rahimi and Askari [18] obtained narrow FWHM of 0.17 nm and an ultrahigh FOM of 8530/RIU.…”

Section: Introductionmentioning

confidence: 99%

Mirror-backed dielectric metasurface sensor with ultrahigh figure of merit based on super-narrow Rayleigh anomaly

Wang,

Xiong,

Tian

et al. 2021

Preprint

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“…Currently there are many methods and optical schemes to determine the refraction index. These include methods with volume schemes like Kretschman configuration [3], fiber schemes [4,5], waveguide schemes based on microresonators [6] and diffraction schemes [7,8]. Each of these schemes has its advantages and disadvantages.…”

Section: Introductionmentioning

confidence: 99%

Angular properties of refractive index sensor based on reflection interferometer

Terentyev

V.A.

2022

Optics and Spectroscopy

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The angular properties of sensor, implemented in Kretschmann?s scheme, where the optimized for oblique incidence of light thin-film reflection interferometer acts as a sensing element, are described in the paper. Analytical equations, defining the sensor?s properties for S and P polarization states at working wavelength in vicinity of working angle of incidence, are provided, as well as approximate equations for main parameters of sensor: sensitivity, angular full width at half maximum, contrast and figure of merit. The possibility to vary the named parameters by choosing appropriate metal and dielectric layers of the structure is shown. For an example, the numerical calculations are made for one of special cases, optimized for S polarization state, as having larger figures of merit. The dependencies of angular properties on number of layers and base thickness are demonstrated. It is shown, that angular measurements with this method are theoretically capable of infinite figures of merit, and in practice they are only limited by losses in layered structure and beam divergency. The recommendations for experimental realization of method are given. Keywords: reflection interferometer, total internal reflection, refractive index sensor.

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“…Сенсоры на основе эффекта нарушенного полного внутреннего отражения применяются для измерения коэффициента преломления газов, жидкостей, в частности, в биологических приложениях [1,2], поэтому их исследование активно ведется в настоящее время. Вариантами реализации таких сенсоров являются разные оптические схемы, в частности схема Кречмана на основе призмы, или иные схемы на основе дифракционной структуры, в которых в качестве сигнального репера используется узкий спектральный минимум интенсивности в отражении, который в литературе имеет устоявшееся название поверхностного плазмонного резонанса (ППР, surface plasmon resonance, SPR) и который является результатом максимизации поглощения света в сенсорной структуре [3,4]. В настоящей работе исследованы свойства одного из новых вариантов сенсоров, использующих эффект полного внутреннего отражения и поверхностного плазмонного резонанса в конфигурации Кречмана.…”

Section: Introductionunclassified

Аналитическое Описание Спектральных Характеристик Сенсора Коэффициента Преломления На Основе Отражательного Интерферометра

Terent’ev¹,

Simonov²

2021

Оптика И Спектроскопия

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The analytical formulas, describing spectral properties of sensor based on oblique incidence reflection interferometer in Kretschmann optical scheme. The sensor is designed for measuring the refractive index of analyte (liquid or gas) exploiting the effect of total internal reflection in multilayered metal-dielectric structure. The properties of comprised in the structure thin metal layer, that are necessary for optimization of sensor’s spectral profile, are defined. The spectral profile represents peaks with varying width. The oblique quaterwave dielectric layers are also used in the structure. The analytical properties of sensor depending on light polarization are given: resolution, sensitivity, contrast and figure of merit (FOM). It is shown in the paper, that sensor shows high grade parameters in both polarizations, but it is preferably to use S polarization to maximize FOM due to higher finesse in the sensor structure. The method of fabrication of such sensor structure with optical control during vacuum sputtering is proposed.

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Ultrahigh-figure-of-merit refractive index sensor based on the Rayleigh anomaly resonance

Cited by 10 publications

References 34 publications

Mirror-backed dielectric metasurface sensor with ultrahigh figure of merit based on super-narrow Rayleigh anomaly

Mirror-backed dielectric metasurface sensor with ultrahigh figure of merit based on super-narrow Rayleigh anomaly

Angular properties of refractive index sensor based on reflection interferometer

Аналитическое Описание Спектральных Характеристик Сенсора Коэффициента Преломления На Основе Отражательного Интерферометра

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