Abstract:A metal-reactive oxide-silicon carbide (SiC) sensor, responding to oxygen gas, was fabricated using a La x Ce 1−x O z layer deposited between 4H-SiC substrate and Al gate as a function of postdeposition annealing (PDA) of the oxide layer from 400 to 1000°C. Sensitivity of the sensor increased with increasing of the PDA temperature. Current-time and currentgate voltage response was investigated in ultralow voltage regime under a forward bias of 0.3 V to study sensitivity of the sensor. Sensing mechanism of the … Show more
Nitrogen-infused wet oxidation process was carried out for 30 min at dissimilar temperatures (400 C, 600 C, 800 C, and 1000 C) onto Ga x Ce y O z films deposited on Si substrate. Polycrystalline Ga x Ce y O z films were obtained with an
Nitrogen-infused wet oxidation process was carried out for 30 min at dissimilar temperatures (400 C, 600 C, 800 C, and 1000 C) onto Ga x Ce y O z films deposited on Si substrate. Polycrystalline Ga x Ce y O z films were obtained with an
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.