2006
DOI: 10.1143/jjap.45.l373
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Ultrashallow Arsenic n+/p Junction Formed by AsH3 Plasma Doping

Abstract: We have investigated the ultrashallow n+/p junction formed by AsH3 plasma doping (PLAD) and the effect of hydrogen on dopant activation. Since hydrogen balance gas (99% H2) was used for AsH3 PLAD, the incorporation of a significant concentration of hydrogen resulted after PLAD. The incorporated hydrogen caused various problems, such as low dopant activation, high resistance, and high leakage current. These problems were traced to hydrogen-induced damage, which was confirmed by cross-sectional transmission elec… Show more

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Cited by 6 publications
(4 citation statements)
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“…In crystalline ZnO, for example, subgap states cause a characteristic green luminescence. 1 In amorphous oxide semiconductors like a-In-Ga-Zn-O or a-Zn-Sn-O which are used for thin-film-transistor liquidcrystal displays on flexible substrates, these subgap states may be the reason why p-type inversion operations in thin-film-transistors have not been achieved so far. 2 The microstructural origin of the subgap states in a-In-Ga-Zn-O and in other amorphous oxides is currently under debate.…”
Section: Introductionmentioning
confidence: 99%
“…In crystalline ZnO, for example, subgap states cause a characteristic green luminescence. 1 In amorphous oxide semiconductors like a-In-Ga-Zn-O or a-Zn-Sn-O which are used for thin-film-transistor liquidcrystal displays on flexible substrates, these subgap states may be the reason why p-type inversion operations in thin-film-transistors have not been achieved so far. 2 The microstructural origin of the subgap states in a-In-Ga-Zn-O and in other amorphous oxides is currently under debate.…”
Section: Introductionmentioning
confidence: 99%
“…The blue emissions at 478 nm, together with the blue green emission at 492 nm are probably from oxygen vacancies or other defects. The origin of green emission at 528 nm can be ascribed to the single ionized oxygen vacancies [29][30][31]. These oxygen vacancies are allowed to be recombine with the photo generated holes and resulted in green emission.…”
Section: Pl Analysismentioning
confidence: 99%
“…Hydrogen is often present during SPE anneals of surface a-Si layers as it readily infiltrates from the surface oxide or ambient. [3,19] This indiffusion is well described by a trap diffusion model with a segregation coefficient of 0.064 at 606 o C. [22] Cluster implantation of decaborane (B 10 H 14 ) [23] or dopant-hydride plasma doping [24] also result in the presence of H in the amorphous layer. Hydrogen has been observed to reduce the SPE interface velocity by as much as 50% in Si [19] and 70% in Ge [5].…”
Section: The Behaviour Of Hydrogen During Spementioning
confidence: 99%