Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, unless calibration model and number of standard connections are somehow optimized. In this paper we present an optimized solution €or a practical set of multiport problems, where calibration model can be divided in two separate teaky halves, neglecting leakage between them. This problem is typical for multiport onwafer measurements, where mdti-signal probes (e.g. GSGSG) are implied, We will show that with a proper choice of calibration standards, the optimized calbration procedure takes the same time of a classical two port LRM or TRL.Index Tem-Multiport VNA, multiport S-parameters, multiport calibration, leaky calibration, multiport error model, leaky error model, on-wafer calibration.