Unconventional morphologies of symmetric, diblock copolymers due to film thickness constraints

Russell, Thomas P.; Menelle, A.; Anastasiadis, Spiros H.; Satija, Sushil K.; Majkrzak, C. F.

doi:10.1021/ma00023a032

Cited by 104 publications

(124 citation statements)

References 18 publications

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“…The fit to the reflectivity data is perfect. The profile p(z) is significantly different from the profile determined by Russell et al (1991). The scattering density is higher close to the air interface for the present profile.…”

Section: Diblock Copolymer Filmcontrasting

confidence: 85%

“…6 of Russell et al (1991). The sample is a film of a symmetric poly-(styrene-b-methylmethacrylate) diblock copolymer on a silicon substrate, with the styrene block perdeuterated.…”

Section: Diblock Copolymer Filmmentioning

confidence: 99%

“…6. In the original analysis by Russell et al (1991), a box model was fitted to the data. The scattering density Russell et al (1991)].…”

Section: Diblock Copolymer Filmmentioning

confidence: 99%

“…In the original analysis by Russell et al (1991), a box model was fitted to the data. The scattering density Russell et al (1991)]. The full curve is the fit smeared by instrumental resolution using splines as basis functions for p(z).…”

Section: Diblock Copolymer Filmmentioning

confidence: 99%

“…Examples where these methods have recently been applied include studies of smectic liquid-crystal films (Ocko, Braslau, Pershan, Als-Nielsen & Deutsch, 1986;Gramsbergen, de Jeu & Als-Nielsen, 1986), amphiphiles at a liquid/vapor interface (Swislow, Schwartz, Ocko, Pershan & Litster, 1991;Als-Nielsen & Kjaer, 1989), polymers in solution (Schlossman et al, 1991), adsorbed polymers (Cosgrove, Heath, Phipps & Richardson, 1991;Guiselin, Lee, Farnoux & Lapp, 1991), homopolymer and block copolymer thin films (Russell, 1990;Russell, Menelle, Anastasiadis, Satija & Majkrzak, 1991;de Jeu et al, 1993) and inorganic multilayers (Cowley & Ryan, 1987). For the determination of scattering density profiles normal to the surface, specular reflectivity studies are performed where the incident and reflected waves are in a plane perpendicular to the surface.…”

Section: Introductionmentioning

confidence: 99%

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Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

Pedersen¹,

Hamley²

1994

J Appl Crystallogr

135

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Two methods for the determination of scatteringlength density profiles from specular reflectivity data are described. Both kinematical and dynamical theory can be used for calculating the reflectivity. In the first method, the scattering density is parameterized using cubic splines. The coefficients in the series are determined by constrained nonlinear least-squares methods, in which the smoothest solution that agrees with the data is chosen. The method is a further development of the two-step approach of Pedersen [J. Appl. Cryst. (1992), 25, 129-145-1. The second approach is based on a method introduced by Singh, Tirrell & Bates [J. Appl. Cryst. (1993), 26, 650-659] for analyzing reflectivity data from periodic profiles. In this approach, the profile is expressed as a series of sine and cosine terms. Several new features have been introduced in the method, of which the most important is the inclusion of a smoothness constraint, which reduces the coefficients of the higher harmonics in the Fourier series. This makes it possible to apply the method also to aperiodic profiles. For the analysis of neutron reflectivity data, the instrumental smearing of the model reflectivity is important and a method for fast calculation of smeared reflectivity curves is described. The two methods of analyzing reflectivity data have been applied to sets of simulated data based on examples from the literature, including an amphiphilic monolayer and block copolymer thin films. The two methods work equally well in most situations and are able to recover the original profiles. In general, the method using splines as the basis functions is better suited to aperiodic than to periodic structures, whereas the sine/cosine basis is well suited to periodic and nearly periodic structures.

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Section: Diblock Copolymer Filmcontrasting

confidence: 85%

“…6 of Russell et al (1991). The sample is a film of a symmetric poly-(styrene-b-methylmethacrylate) diblock copolymer on a silicon substrate, with the styrene block perdeuterated.…”

Section: Diblock Copolymer Filmmentioning

confidence: 99%

“…6. In the original analysis by Russell et al (1991), a box model was fitted to the data. The scattering density Russell et al (1991)].…”

Section: Diblock Copolymer Filmmentioning

confidence: 99%

Section: Diblock Copolymer Filmmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

Pedersen¹,

Hamley²

1994

J Appl Crystallogr

135

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Combinatorial Methods for Polymer Science

Meredith

Smith

Crosby

et al. 2002

Encyclopedia of Polymer Science and Technology

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This article presents recent advances in which combinatorial methodologies have been used for efficient measurement of chemical and physical properties of polymers over large regimes of variable space. Methodologies for both synthesis and characterization allow for both materials discovery and discovery of new models and structureprocessing-property relationships. Polymer synthesis with combinatorial methods relies primarily on reactant mixing and diversity to create discrete libraries for investigating reactant structure and composition variations. In the future, techniques will be developed to allow library variation in processing variables like temperature, UV exposure, and pressure during synthesis. Several recent developments are presented in the combinatorial characterization of polymers, using high throughput libraries of films and coatings. As examples, four novel techniques are developed for preparing continuous gradient polymer libraries with controlled variations in temperature, composition, thickness, and substrate surface energy. The use of these new library techniques facilitates characterization of polymer blend phase behavior, thin-film dewetting, block copolymer order-disorder transitions, and polymer adhesion.

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Ordering in thin films of asymmetric diblock copolymers

Kim

Russell

2001

J. Polym. Sci. B Polym. Phys.

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Unconventional morphologies of symmetric, diblock copolymers due to film thickness constraints

Cited by 104 publications

References 18 publications

Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

Combinatorial Methods for Polymer Science

Ordering in thin films of asymmetric diblock copolymers

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