1991
DOI: 10.1016/0378-4371(91)90384-o
|View full text |Cite
|
Sign up to set email alerts
|

Universality in the 2D localization problem

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

8
33
1

Year Published

1992
1992
2021
2021

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 30 publications
(42 citation statements)
references
References 18 publications
8
33
1
Order By: Relevance
“…The localization properties of symplectic models have previously been analyzed numerically [12,[15][16][17][18][19][20] from which a metal-insulator transition can be inferred. The most recent calculations of Fastenrath [20,21] report a critical exponent ν = 2.75 for the localization length at the band centre, E/V = 0, together with a critical disorder W c = 5.74 V for a constant probability distribution of the on-site disorder potentials {ε m } and a spin-orbit strength S = 0.5.…”
mentioning
confidence: 99%
“…The localization properties of symplectic models have previously been analyzed numerically [12,[15][16][17][18][19][20] from which a metal-insulator transition can be inferred. The most recent calculations of Fastenrath [20,21] report a critical exponent ν = 2.75 for the localization length at the band centre, E/V = 0, together with a critical disorder W c = 5.74 V for a constant probability distribution of the on-site disorder potentials {ε m } and a spin-orbit strength S = 0.5.…”
mentioning
confidence: 99%
“…Anyway, in two dimensions, these two classes do not show the Anderson transition. In contrast, the symplectic class is known to exhibit the Anderson transition in two-dimensional systems [2][3][4][5][6].…”
mentioning
confidence: 99%
“…For the states at the center of the band (E = 0), the critical point of this model has been estimated as W c = 5.74V by the finite-size scaling method [3,5]. We confine ourselves in this letter to the case of the band center (E = 0) for simplicity.…”
mentioning
confidence: 99%
See 2 more Smart Citations