Unlocking the potential of half-metallicSr2FeMoO6films through controlled stoichiometry and double-perovs

Scaling of Spin Hall Angle in 3d, 4d, and 5d Metals fromY3Fe5O12Wang1, Du2, Pu3 et al. 2014Phys. Rev. Lett.478413394View full textAdd to dashboardCite

“…Due to current shunting of the metallic FMs and potential confounding effects of anisotropic magnetoresistance (AMR) or anomalous Hall effect (AHE), the reported values of  SH vary significantly, sometimes by more than one order of magnitude for the same materials [14]. Here we report a systematic study of FMR spin pumping from insulating Y 3 Fe 5 O 12 (YIG) epitaxial thin films grown by sputtering [15][16][17][18][19][20][21][22] into six normal metals, Cu, Ag, Ta, W, Pt and Au, that span a wide range in two key parameters: a factor of ~50 in spin-orbit coupling strength [23] and over two orders of magnitude variation in spin diffusion length ( SD ) [4,[24][25][26]. Due to their weak spin-orbit coupling and relatively long spin diffusion lengths, Cu and Ag present a significant challenge for ISHE detection of spin pumping.…”

“…We characterize the structural quality of our epitaxial YIG films deposited on (111)-oriented Gd 3 Ga 5 O 12 (GGG) substrates using off-axis ultrahigh vacuum (UHV) sputtering [15][16][17][18][19][20][21][22] by high-resolution x-ray diffraction (XRD). A representative θ-2θ scan of a 20-nm YIG film shown in Fig.…”

Strain-tunable extraordinary magnetocrystalline anisotropy inSr2CrReO6epitaxial films

“…We use off-axis sputtering [9,[14][15][16][20][21][22][23]] to deposit 90 nm thick Sr 2 CrReO 6 (001) films on (LaAlO 3 ) 0.3 (Sr 2 AlTaO 6 ) 0.7 (LSAT), SrTiO 3 (STO), and a relaxed SrCr 0.5 Nb 0.5 O 3 (SCNO) buffer layer on LSAT with lattice constants a = 3.868Å, 3.905Å and 3.946Å, respectively (see Supplemental Material for growth parameters). As a comparison, the pseudocubic lattice constants of bulk Sr 2 CrReO 6 are a p = 3.907Å and c p = 3.905Å [10].…”

A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation

“…For clean specimens <10 nm in thickness, it is possible to chemically identify atomic columns determined by the corresponding HAADF intensity. A specimen that permits quantitative HAADF-STEM imaging and the corresponding column identification is shown in Figures 7a and 7b, respectively (Hauser et al, 2011). The HAADF image was acquired using a third-order aberration-and probecorrected Titan STEM equipped with an annular dark-field detector (E.A.…”