Unraveling Dissipation-Related Features in Magnetic Imaging by Bimodal Magnetic Force Microscopy

Jaafar, Miriam; Asenjo, A.

doi:10.3390/app112210507

Cited by 3 publications

(1 citation statement)

References 35 publications

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“…The EFM (phase or frequency) signal often resembles the topography, as reported in various publications [1,6,10]. This effect is also observed in Magnetic Force Microscopy (MFM) [11,12]. In both methods, EFM and MFM, the cause for the topographic crosstalk is the same namely capacitive coupling effects between tip and substrate due to the mode of operation, the so-called lift mode.…”

Section: Introductionmentioning

confidence: 60%

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Fuhrmann

Musyanovych²,

Thoelen³

et al. 2022

J. Phys. Commun.

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Electrostatic Force Microscopy has been proven to be a precise and versatile tool to perform quantitative measurements of the dielectric constant of thin film domains in the nanometer range. However, it is difficult to measure non-planar nanostructures because topographic crosstalk significantly contributes to the measured signal. This topographic crosstalk due to distance changes between tip and substrate measuring non-planar surface structures is still an ongoing issue in literature and falsifies measurements of the dielectric constant of nanostructures and nanoparticles. Tip and substrate form a capacitor based on the contact potential difference between the tip and substrate material. An increase of the distance between tip and substrate causes a repulsive force while a decrease causes an attractive force. Thus, measuring in the so-called lift mode scanning the surface in a second scan following the topography determined by a first scan leads to a mirroring of the non-planar surface structure in the electrostatic signal superimposing the signal from dielectric contrast. In this work we demonstrate that the topographic crosstalk can be avoided by using the linear mode instead of the lift mode. The use of the linear mode now allows the determination of the dielectric constant of single nanoparticles.

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Section: Introductionmentioning

confidence: 60%

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Fuhrmann

Musyanovych²,

Thoelen³

et al. 2022

J. Phys. Commun.

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Local magnetic characterization of 1D and 2D carbon nanomaterials with magnetic force microscopy techniques: A review

Impundu

Hussain

Minani

et al. 2023

Materials Today Communications

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Magnetic Domain Structure of Lu2.1Bi0.9Fe5O12 Epitaxial Films Studied by Magnetic Force Microscopy and Optical Second Harmonic Generation

et al. 2022

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Magnetic structure of functional magnetic dielectrics is traditionally of high interest. Here, we use the magnetic force microscopy (MFM) and nonlinear-optical probe of second harmonic generation for studies of surface domain structure of monocrystalline Lu2.1Bi0.9Fe5O12 garnet films. The transformation of the magnetic domains under the application of the dc magnetic field is revealed by the MFM for both the top-view and the cleavage of the iron-garnet layer. Complementary magnetic force and second harmonic generation microscopy show that the considered film reveals the magnetization inclined with respect to the film’s normal, with its orientation being inhomogeneous within the film’s thickness. The second harmonic generation (SHG) microscopy confirms the zigzag structure of the surface-closing domain with the magnetization containing in-plane and out-of-plane magnetization components. We believe that these features of magnetic behavior of garnet films are important for the design of garnet-based magnetic devices.

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Unraveling Dissipation-Related Features in Magnetic Imaging by Bimodal Magnetic Force Microscopy

Cited by 3 publications

References 35 publications

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Local magnetic characterization of 1D and 2D carbon nanomaterials with magnetic force microscopy techniques: A review

Magnetic Domain Structure of Lu2.1Bi0.9Fe5O12 Epitaxial Films Studied by Magnetic Force Microscopy and Optical Second Harmonic Generation

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