2022
DOI: 10.1021/acsapm.2c01283
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Unraveling the Implications of Macromolecular Orientation on the Planar and Vertical Charge Transport in Organic Electronic Devices

Abstract: The role of film morphology of conjugated polymers (CPs) and their macromolecular conformation with respect to the substrate in governing charge transport and overall device performances has been a matter of debate. The nature of the macromolecular orientation of CPs in thin films has a pivotal role in controlling the performance of planar and sandwich devices. Thin-film characterizations unveiled that spin-coated films are isotropic with mixed edge-on/face-on conformation, whereas unidirectional floating film… Show more

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Cited by 19 publications
(16 citation statements)
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“…From the perusal of out‐of‐plane and in‐plane XRD results, it is evident that the UFTM thin films are dominantly edge‐on oriented as well as ordered and crystalline. [ 32 ] Further, the Debye–Scherrer equation for the first diffraction peak (100) at 2 θ = 5.3°, which was the same for all the multilayers, was utilized to evaluate the interplanar d‐spacing and coherent length of domains. [ 38 ] The interplanar d‐spacing for all the multilayer thin films was 1.67 nm, whereas the coherent length of the domains was found to be 23.51 nm, 23.35 nm, and 23.27 nm for 4, 6, and 20 layers, respectively.…”
Section: Resultsmentioning
confidence: 99%
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“…From the perusal of out‐of‐plane and in‐plane XRD results, it is evident that the UFTM thin films are dominantly edge‐on oriented as well as ordered and crystalline. [ 32 ] Further, the Debye–Scherrer equation for the first diffraction peak (100) at 2 θ = 5.3°, which was the same for all the multilayers, was utilized to evaluate the interplanar d‐spacing and coherent length of domains. [ 38 ] The interplanar d‐spacing for all the multilayer thin films was 1.67 nm, whereas the coherent length of the domains was found to be 23.51 nm, 23.35 nm, and 23.27 nm for 4, 6, and 20 layers, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Here, the incident X-rays undergo total external reflection with the grazing incident angle (ω) with respect to the thin-film surface lower than the critical angle (ω c ), i.e., ω < ω c . [30][31][32] Thus, evanescent wave was present within the refracting media that travels parallel to the surface. In this mode, the rapid decrease of evanescent field amplitude resulted in enhanced surface sensitivity of X-rays, with a few nanometers of penetration depths.…”
Section: Optical and Microstructural Characterizationmentioning
confidence: 99%
“…Further, it is well known that edge‐on dominated thin films are highly suitable for the in‐plane charge transport. [ 25 ] From the perusal of Figure 3a, the lamellar (100) peak corresponding to the alkyl stacking in out‐of‐plane XRD for both 4% and 9% exists at 2 θ = 5.25°. The further alkyl stacking peaks can also be seen at the same value of 2 θ for both the thinner and thicker films.…”
Section: Resultsmentioning
confidence: 99%
“…4 Moreover, the conformation of SCPs in the films, such as edge-on or face-on, and the device structure of FETs (precisely, near the gate–dielectric interface) are also well proven to be crucial in governing the charge transport. 8–15…”
Section: Introductionmentioning
confidence: 99%
“…4 Moreover, the conformation of SCPs in the films, such as edge-on or face-on, and the device structure of FETs (precisely, near the gate-dielectric interface) are also well proven to be crucial in governing the charge transport. [8][9][10][11][12][13][14][15] Unidirectional alignment of SCPs in thin films is beneficial for attaining higher FET mobility (m) because carrier transport is high along the conjugation direction. 5 Various solutionprocessable methods have been reported for fabricating thin films of SCPs; however, only a few of them render macroscopic alignment of SCPs in resultant films in FETs.…”
Section: Introductionmentioning
confidence: 99%