“…From the perusal of out‐of‐plane and in‐plane XRD results, it is evident that the UFTM thin films are dominantly edge‐on oriented as well as ordered and crystalline. [ 32 ] Further, the Debye–Scherrer equation for the first diffraction peak (100) at 2 θ = 5.3°, which was the same for all the multilayers, was utilized to evaluate the interplanar d‐spacing and coherent length of domains. [ 38 ] The interplanar d‐spacing for all the multilayer thin films was 1.67 nm, whereas the coherent length of the domains was found to be 23.51 nm, 23.35 nm, and 23.27 nm for 4, 6, and 20 layers, respectively.…”