2023
DOI: 10.1016/j.microrel.2023.114916
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Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects

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Cited by 5 publications
(1 citation statement)
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“…[40] Evidently, this approach lacks persuasiveness because it does not account for the mutual interference between multiple devices in an array and fails to demonstrate the practical effects of array-based implementations. [41][42][43][44][45] Therefore, it is crucial to utilize real EGTs arrays to showcase unsupervised learning.…”
Section: Introductionmentioning
confidence: 99%
“…[40] Evidently, this approach lacks persuasiveness because it does not account for the mutual interference between multiple devices in an array and fails to demonstrate the practical effects of array-based implementations. [41][42][43][44][45] Therefore, it is crucial to utilize real EGTs arrays to showcase unsupervised learning.…”
Section: Introductionmentioning
confidence: 99%