2012
DOI: 10.1016/j.nimb.2012.08.018
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Use of channeling for the study of radiation effects in nuclear materials

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Cited by 11 publications
(7 citation statements)
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“…The dpa were calculated with displacement threshold energies of 20 eV for Zr and 60 eV for O atoms . This plot allows following the phase transition build‐up and may be reproduced with the two‐step accumulation (MSDA) model . The first step could be associated to defect creation and the second one to the phase transition, in good agreement with the two‐step mechanism proposed by Simeone et al .…”
Section: Resultssupporting
confidence: 71%
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“…The dpa were calculated with displacement threshold energies of 20 eV for Zr and 60 eV for O atoms . This plot allows following the phase transition build‐up and may be reproduced with the two‐step accumulation (MSDA) model . The first step could be associated to defect creation and the second one to the phase transition, in good agreement with the two‐step mechanism proposed by Simeone et al .…”
Section: Resultssupporting
confidence: 71%
“…Results are compared to the f d determined by the RBS‐C technique in ex situ conditions . Both damage build‐ups are in very good agreement and may be reproduced using the multi‐step damage accumulation (MSDA) model represented by the equation: fD=truetrue∑i=1n1{}fD,isat0.24emG0.24em[]1normalexp()σi()ΦΦitruetrue∏k=1n[]normalexp()σk+1()ΦΦk+1+ fD,nsatG[]1normalexp()σn()ΦΦn where f D,i sat is the level of damage at saturation, n is the number of steps required for the achievement of the total disordering process, Φ i is the threshold ion fluence of the i th step and σ i the disordering cross section at the i th step. G corresponds to the Heaviside function H multiplied by its argument.…”
Section: Resultsmentioning
confidence: 96%
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“…On the other hand, no tracks but only scarce point defects are created in the S e regime. 12,26 Thus, the value f D ¼ 1 obtained upon I ion irradiation was expected, and the value f D $ 0.2 obtained upon W ion irradiation is very likely due to the (weak) fraction of nuclear collisions created by swift W ions in the near-surface region of SiC crystals. Surprisingly, Figures 3 and 4 show that in this material S n and S e irradiation leads to much lower f D (0.67 at maximum) than that obtained for S n þ S e (f D ¼ 1) or even for the S n irradiation alone (f D ¼ 1).…”
mentioning
confidence: 78%
“…From previous studies, one of the key questions relies on the possibility to determine the amount of damage created in a crystalline material all along the trajectories of incident ions. The channeling technique, generally associated with Rutherford backscattering spectrometry (RBS), is certainly, up to now, the most frequently used methodology to achieve this task . Very recently, high‐resolution transmission electron microscopy (HRTEM) was also implemented to determine the structure of ion tracks from the surface of samples up to several micrometers .…”
Section: Introductionmentioning
confidence: 99%