Electromagnetic interference (EMI) can degrade device performance, particularly a sensitive device such as magnetic recording heads. A high applied voltage generates a high electric field in order to break the electrical air gap during a gold ball bonding process. This work, for the first time, investigates the influence of high voltage pattern of a gold ball bond machine on both electric field and magnetic field as an electromagnetic wave by monitoring an intensity of electromagnetic interference. The investigation was carried out by simulation of a live gold ball bond machine operation by using a finite integral technique. The simulation results reveal that the voltage pattern plays an important role in the intensity of electromagnetic radiation (EMR). In conclusion, an ideal voltage pulse of 2 kV and 4 kV generates the highest EMR detected by a monopole antenna. The induced voltage occuring at the antenna reflecting the intensity of EMI blasting was as high as 33.39 V and 71.36 V, respectively. Smoothening the voltage pattern by incrasing the rise time of voltage to 100 ns only, the induced voltage at the antenna was reduced down to 99.90% and 99.92% compairing with the case of an ideal voltage pulse for the peak EFO voltage of 2 kV and 4kV respectively. This concludes the importance of the voltage pattern during a free air ball forming process; hence lowering the risk of the highly sensitive deivce to be damaged by EMI blasting.