Using X-parameters to model mixers

Xie, Chengcheng; Zhang, Tao; Liu, Di

doi:10.1109/icmmt.2012.6230227

Cited by 11 publications

(3 citation statements)

References 2 publications

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“…The authors treat the PA as a 'mixer' and see the envelope port as the 'LO port' (with 10 MHz input tones) of the 'mixer'. In this way, the well-formatted and studied three-port X-parameters for mixers can be utilized for modeling the PA [14]. The authors extract both a three-port and a static X-parameter model for the DUT.…”

Section: Modeling Three-port Rf Pasmentioning

confidence: 99%

Applications of X-parameters in behavioral modeling of RF power amplifiers for wireless communications: An overview

Wang

Larsen

2015

2015 17th International Conference on Transparent Optical Networks (ICTON)

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X-parameters are developed as an extension of S-parameters. They are capable of characterizing and modeling nonlinear systems. One of the most popular and important area where X-parameters find their usefulness is behavior modeling of radio-frequency power amplifier. Based on review of current literature, as well as discussion on the latest in-house research, this paper presents an overview of the theory and practical applications of X-parameter-based behavior modeling technique. The focus is put on the applications of X-parameters in characterizing and modeling various type of radio-frequency power amplifier. Future research direction in this area is also discussed.

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Section: Modeling Three-port Rf Pasmentioning

confidence: 99%

Applications of X-parameters in behavioral modeling of RF power amplifiers for wireless communications: An overview

Wang

Larsen

2015

2015 17th International Conference on Transparent Optical Networks (ICTON)

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“…Using the presented modeling approach, one can use the extracted parameters directly inside commercial available simulation tools in a way to simulate the behavior of the device, as will be shown in Section V. This is possible because the present state of such simulations tools are already prepared to deal with models of RF mixers [13]. Moreover, RF mixers have in essence a similar spectral behavior compared to the previously described mixed-signal devices.…”

Section: A Model Formulationmentioning

confidence: 99%

Synchronous Oversampled Measurements for the Extraction of Mixed-Signal Behavioral Models in Digital to Analog Integrated Transmitters

Ribeiro

Cruz

Carvalho

2014

IEEE Trans. Microwave Theory Techn.

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This paper presents an extraction procedure and a new modeling approach for behavioral model approximations of mixed-signal digital to analog integrated transmitters. An explanation on how to extract the seek kernels for a specific device is shown, including a new procedure for phase synchronization. The characterization procedure is applied to a real device. The simulation outcomes using the extracted model are then compared with real modulated signal measurements. The obtained results validate the proposed strategy and enhance the utility of the framework.Index Terms-Digital-to-analog converter (DAC), instrumentation and measurement, integrated microwave circuits and systems, mixed signal, RF device modeling and characterization, softwaredefined radio (SDR). 0018-9480

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“…Fortunately, the X-parameter of the down-converted mixer generated by Advanced Design System (ADS) software was defined, simulated and verified in 2012. Unfortunately, it was not verified using the measured X-parameter of the mixer [5]. Therefore, to investigate and verify the measured Xparameter for the down-converted mixer in the frequency and time domain is helpful in future system-level simulation for system engineering designers.…”

Section: Introductionmentioning

confidence: 97%

Down-converted mixer verification using the measured X-parameter for system engineering designers

Hsiao

Tsai

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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This paper investigates the down-converted mixer verification using the measured X-parameter in future systemlevel simulation. The X-parameter measurement system utilizing Agilent's nonlinear vector network analyzer (NVNA) and the external RF signal generator can provide the desired stimulus to device under test (DUT) at the specified port in order to measure and respond to the non-linear DUT characteristic. The Xparameter of the down-converted mixer may include the measured nonlinear output power and phase at the specified frequencies. Also, the down-converted mixer utilizing nonlinear device characteristic to convert RF to intermediate frequency (IF) can be described by the X-parameter with good consistency.

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Using X-parameters to model mixers

Cited by 11 publications

References 2 publications

Applications of X-parameters in behavioral modeling of RF power amplifiers for wireless communications: An overview

Applications of X-parameters in behavioral modeling of RF power amplifiers for wireless communications: An overview

Synchronous Oversampled Measurements for the Extraction of Mixed-Signal Behavioral Models in Digital to Analog Integrated Transmitters

Down-converted mixer verification using the measured X-parameter for system engineering designers

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