Utilization of ELITE System for Precise Fault Localization of Metal Defect Functional Failure

Apolinaria, Ronald C.

doi:10.1109/ipfa49335.2020.9260612

2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2020

DOI: 10.1109/ipfa49335.2020.9260612

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Utilization of ELITE System for Precise Fault Localization of Metal Defect Functional Failure

Ronald C. Apolinaria

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Cited by 3 publications

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Fault Localization of Functional Failure by using Dynamic EMMI Analysis Technique

Ouyang¹,

Wei²,

Lin³

et al. 2022

2022 23rd International Conference on Electronic Packaging Technology (ICEPT)

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Utilization of ELITE System for Precise Fault Localization of Metal Defect Functional Failure

Cited by 3 publications

References 3 publications

Fault Localization of Functional Failure by using Dynamic EMMI Analysis Technique

Fault Localization of Functional Failure by using Dynamic EMMI Analysis Technique

Enhanced technique through pattern and power modulation with ELITE system for failure analysis on advance package technology

Defect localization on operating condition failure of 3D NAND device level using modified Lock-in thermography

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