2020
DOI: 10.1016/j.jallcom.2020.154126
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Utilizing compliance current level for controllability of resistive switching in nickel oxide thin films for resistive random-access memory

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Cited by 23 publications
(11 citation statements)
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“…Stop voltages of SET and RESET process are defined as V SET and V RESET . In general, two different switching types are defined as unipolar and bipolar [28][29][30], as illustrated in Figure 2. The unipolar switching mode is defined by the amplitude of the applied voltage bias while bipolar switching depends on the polarity of the applied voltage bias.…”
Section: Biological (Silk Protein) Polymer (Pvk) Perovskite (Ch3nh3snmentioning
confidence: 99%
See 2 more Smart Citations
“…Stop voltages of SET and RESET process are defined as V SET and V RESET . In general, two different switching types are defined as unipolar and bipolar [28][29][30], as illustrated in Figure 2. The unipolar switching mode is defined by the amplitude of the applied voltage bias while bipolar switching depends on the polarity of the applied voltage bias.…”
Section: Biological (Silk Protein) Polymer (Pvk) Perovskite (Ch3nh3snmentioning
confidence: 99%
“…The unipolar switching mode is defined by the amplitude of the applied voltage bias while bipolar switching depends on the polarity of the applied voltage bias. In addition, as one of NVM devices, the endurance and retention properties of RRAM are also the presence of device reliability [4][5][6][7][28][29][30].…”
Section: Biological (Silk Protein) Polymer (Pvk) Perovskite (Ch3nh3snmentioning
confidence: 99%
See 1 more Smart Citation
“…A tantalum layer supported nickel oxide-based device exhibited BRS, where the low resistance state (LRS) was followed by an Ohmic conduction behavior and the high resistance state (HRS) displayed a combined effect of Ohmic behavior and space-charge-limited conduction mechanism for the high and low-voltage regions, respectively . Compliance current dependent resistive switching in nickel oxide thin films for random-access memory application showed both URS and BRS behaviors where the HRS was dominated by the Schottky emission mechanism in both the cases . A nickel oxide-based flexible memory device with the resistance ratio of 10 3 exhibited Ohmic conduction mechanism for both LRS and HRS .…”
Section: Results and Discussionmentioning
confidence: 99%
“…Nonvolatile memory is the basic unit in a computer where data is stored to perform logical operations [1][2][3][4]. With the development of modern electronic technology and further miniaturization of silicon semiconductor devices, new memory technologies have been vigorously developed [5][6][7][8].…”
Section: Introductionmentioning
confidence: 99%