2022
DOI: 10.1007/s12633-022-01846-w
|View full text |Cite
|
Sign up to set email alerts
|

UWBG AlN/β-Ga2O3 HEMT on Silicon Carbide Substrate for Low Loss Portable Power Converters and RF Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(2 citation statements)
references
References 41 publications
0
2
0
Order By: Relevance
“…Furthermore, researchers are actively exploring the use of UWBG materials such as AlN and h-BN thin interlayers for β-Ga 2 O 3 SBDs to achieve higher Schottky barrier heights and BVs. Recently, Baskaran et al [127] investigated an AlN/β-Ga 2 O 3 high-electron-mobility transistor (HEMT) on a SiC substrate for power converters and RF applications. Similar to AlN, BN is emerging as a UWBG material with a bandgap of ~6.0 eV and a critical field of ~10 MV/cm [128][129][130].…”
Section: β-Ga 2 O 3 Heterostructures With Other Uwbg Semiconductorsmentioning
confidence: 99%
“…Furthermore, researchers are actively exploring the use of UWBG materials such as AlN and h-BN thin interlayers for β-Ga 2 O 3 SBDs to achieve higher Schottky barrier heights and BVs. Recently, Baskaran et al [127] investigated an AlN/β-Ga 2 O 3 high-electron-mobility transistor (HEMT) on a SiC substrate for power converters and RF applications. Similar to AlN, BN is emerging as a UWBG material with a bandgap of ~6.0 eV and a critical field of ~10 MV/cm [128][129][130].…”
Section: β-Ga 2 O 3 Heterostructures With Other Uwbg Semiconductorsmentioning
confidence: 99%
“…Furthermore, along with the choice of suitable material, device design strategy is crucial to fully attain the potential of any material. Recently, several groups have demonstrated Ga 2 O 3 -based HEMTs with buffer layer engineering, gate and substrate engineering, etc [13][14][15]. Various other device design strategies, such as the implementation of a highly doped cap layer with a sub-micron gate recess process [16], incorporation of a highly doped channel with a T-shaped gate [17], and ultra-scaled delta-doped FET [18], have also been reported.…”
Section: Introductionmentioning
confidence: 99%