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X-ray fluorescence method for determining the mass absorption coefficient in two-layer thin-film Ti/Ge and Ni/Ge systems

“…The accuracy of the calculation of these coefficients has a considerable effect on the uncertainty in determination of both the elemental concentrations and the thickness of the layers in the analyte systems. Thus the comparison of the mass attenuation coefficients carried out in [1] using the nine most complete sources showed that there is a significant spread in the data, especially in the case of light elements.Previously, in studying two-layer composites, we used both single-component monolayer and two-layer films [2] and also two-layer systems in which one layer was multicomponent and the other was single-component [3,4]. In calculating the mass absorption coefficients, taking into account attenuation of the primary emission from the x-ray tube and attenuation of the analytical lines for the elements of the bottom layer in the top layer, we used a very labor-intensive method involving deposition of a second layer on the monolayer single-component films.…”

“…Previously, in studying two-layer composites, we used both single-component monolayer and two-layer films [2] and also two-layer systems in which one layer was multicomponent and the other was single-component [3,4]. In calculating the mass absorption coefficients, taking into account attenuation of the primary emission from the x-ray tube and attenuation of the analytical lines for the elements of the bottom layer in the top layer, we used a very labor-intensive method involving deposition of a second layer on the monolayer single-component films.…”

X-ray fluorescence method for determining the thickness of an aluminum coating on steel

“…The authors of [6] used XFA to determine the thicknesses of thin coatings (with surface density m s < 500 μg/cm 2 ), which then were used as single-component reference samples in xray spectral microanalysis. Earlier, techniques were proposed for determination of the thickness of thin monolayer multicomponent [7,8] and bilayer films, both single-component [9,10] and composites in which one layer was multicomponent [11,12]. This work was devoted to developing a technique for a nondestructive method for determining the thickness (d Al ≤ 100 μm) of an aluminum coating deposited on a steel 47 NKhR substrate (c Ni = 46.25%, c Fe = 47.35%, c Mn = 0.40%, c Cr = 5.25%).…”

X-ray fluorescence analysis of Ni–Fe–Mn/Cr systems

“…Analysis of experimental data suggests that it is expedient to use systems based on iron and nickel with addition of dopants in the form of cobalt, manganese, molybdenum, chromium, and phosphorus to make magnetic films. Development of the technology for production of thin films with specified properties requires constant monitoring in each stage of their fabrication.Earlier we presented procedures for determining the composition and thickness of thin monolayer multicomponent [1, 2] and two-layer films, both single-component [3,4] and composites where one layer is single-component and the second layer is two-component [5,6]. This paper is devoted to development of a procedure for determining the composition and thickness of films of the Ni-Fe-Mn/Cr system, the top layer of which is three-component.…”

“…Earlier we presented procedures for determining the composition and thickness of thin monolayer multicomponent [1, 2] and two-layer films, both single-component [3,4] and composites where one layer is single-component and the second layer is two-component [5,6]. This paper is devoted to development of a procedure for determining the composition and thickness of films of the Ni-Fe-Mn/Cr system, the top layer of which is three-component.…”