Supporting Information Experimental section Synthesis. NiO materials were synthesized by thermal decomposition of Ni 3 O 2 (OH) 4. 1 Practically, 800 mg of the precursor were placed in an alumina crucible and then heated for 2 hours in a muffle furnace in air at temperatures ranging from 250 and 900 ° C (heating rate = 10°C/min). Samples were cooled down to room temperature by turning off the oven, and then stored in the desiccator with KOH. Hereafter samples labelled NiO-T refer as to materials prepared at the synthesis temperature T (°C). For T in the 250-500 °C and 500-800 °C ranges, materials were black and grey, respectively. Above 800 ° C, NiO is greenish as expected for the 1:1 stoichiometry. X-ray diffraction. In situ temperature X-Ray diffraction patterns were recorded for 2h in the 10-90° 2θ range with a 0.008° step on a Bruker D8 Advance diffractometer (Cu K-L2,3 radiation, LinxEye detector) equipped with a XRK 900 Anton Paar reactor chamber. Data were collected at 30°C, then from 50 °C to 700 °C every 50 °C with a 10°C.min-1 heating rate. Room temperature X-Ray diffraction patterns for the microstructural analysis were recorded in the 5-120° 2θ range with a 0.026° step and 400 s by step on a Panalytical X'PERT Powder diffractometer (Cu K-L2,3 radiation, 40 kV, 40 mA, PixCell1D detector). All phase analyses were performed using the HighScore Plus software and all data refinements were carried out with the Fullprof suite software 2 taking into account both crystallite size and strains for the peak broadening.