2018
DOI: 10.7567/apex.11.021002
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Valence band edge tail states and band gap defect levels of GaN bulk and InxGa1−xN films detected by hard X-ray photoemission and photothermal deflection spectroscopy

Abstract: Tail states near the valence band maximum (VBM) and in-gap states of GaN bulk and InxGa1−xN films are observed by hard X-ray photoemission spectroscopy, and the fine structures of these defect states are characterized by photothermal deflection spectroscopy. The defects are enhanced with increasing InN mole fraction, indicating that they originate in cation-related defects and their complexes. The structural disorder, defined as the inverse of the slope of the VBM, becomes larger. Taking the semiconductor prop… Show more

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Cited by 19 publications
(8 citation statements)
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“…To further understand the influence of CsBr on sp-NiO x film, we measured the defect levels in the band gap of NiO x by using photothermal deflection spectroscopy (PDS). The band gap of sp-NiO x was estimated to be 3.6–3.7 eV from UV–visible absorption spectra. The slopes between 3.30 and 3.80 eV for pristine sp-NiO x and CsBr modified sp-NiO x were 0.74 and 0.86, respectively, as shown in Figure .…”
Section: Results and Discussionmentioning
confidence: 99%
“…To further understand the influence of CsBr on sp-NiO x film, we measured the defect levels in the band gap of NiO x by using photothermal deflection spectroscopy (PDS). The band gap of sp-NiO x was estimated to be 3.6–3.7 eV from UV–visible absorption spectra. The slopes between 3.30 and 3.80 eV for pristine sp-NiO x and CsBr modified sp-NiO x were 0.74 and 0.86, respectively, as shown in Figure .…”
Section: Results and Discussionmentioning
confidence: 99%
“…Photothermal deflection spectroscopy (PDS) was used for different treatments of the NiO x surface to characterize the defect levels present in the perovskite/NiO x and NiO x /ITO bandgaps. PDS is a suitable method because it enables the detection of the defect levels for all charge states within the measured sample depth; it detects the charge states in accordance with the absorption coefficient. In this case, monochromatic light was used to irradiate the sample surface. The light source was a halogen lamp modulated at a chopping frequency ranging between 7 and 11 Hz with incident light at a normal angle to the sample surface.…”
Section: Methodsmentioning
confidence: 99%
“…To further investigate the polymer order in depth, we conducted photothermal deflection spectroscopy (PDS) of the NPI-based polymers and PNPE2T (Figure a). The PDS signals of the polymers dropped at the energy corresponding to the band gap, which was consistent with their UV–vis–NIR absorption spectra. We estimated the Urbach energy ( E U ) from the following equation using a fit to the PDS spectra: α­( E ) = α 0 exp­[( E g – E 0 )/ E U ], where α 0 and E 0 are constants .…”
Section: Resultsmentioning
confidence: 60%