2000
DOI: 10.1002/1521-3951(200006)219:2<351::aid-pssb351>3.0.co;2-z
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Variable Range Hopping Conduction in p-Type CuInTe2

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Cited by 11 publications
(3 citation statements)
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“…This suggests that the conduction in the impurity band is due to a variable-range-hopping mechanism of Efros-Shklovskii type [20] with ρ = ρ 0ES exp(T 0ES /T ) 1/2 . The parameters obtained from the fit are ρ 0ES ≈ 1.4 × 10 3 , and T 0ES ≈ 2.2 × 10 3 K. This value of T 0ES is of the same order as that reported for CuInTe 2 , which is 3.4 × 10 3 K [21].…”
Section: Electrical Propertiessupporting
confidence: 77%
“…This suggests that the conduction in the impurity band is due to a variable-range-hopping mechanism of Efros-Shklovskii type [20] with ρ = ρ 0ES exp(T 0ES /T ) 1/2 . The parameters obtained from the fit are ρ 0ES ≈ 1.4 × 10 3 , and T 0ES ≈ 2.2 × 10 3 K. This value of T 0ES is of the same order as that reported for CuInTe 2 , which is 3.4 × 10 3 K [21].…”
Section: Electrical Propertiessupporting
confidence: 77%
“…By Wahab et al [32] [43] were fabricates CuInS 2 thin films material by thermal evaporation method and studied their electrical dc conductivity and activation energy in the temperature range between 150-300 0 C. The conductivity values were between 76. [35,46]. A crossover conduction from Mott to ES VRH behavior, by lowering temperature, was reported in CuInTe 2 [35,52] down to 0.4 K. In Cu-ternaries VRH conduction occurs at relatively high temperatures of up to.…”
Section: Mobility and Carrier Concentration Of Cuins 2 Thin Filmsmentioning
confidence: 86%
“…[35,46]. A crossover conduction from Mott to ES VRH behavior, by lowering temperature, was reported in CuInTe 2 [35,52] down to 0.4 K. In Cu-ternaries VRH conduction occurs at relatively high temperatures of up to.…”
Section: Mobility and Carrier Concentration Of Cuins 2 Thin Filmsmentioning
confidence: 86%