1980
DOI: 10.1016/0167-2584(80)90256-x
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Variations of work function and surface conductivity on clean cleaved zinc oxide surfaces by annealing and by hydrogen adsorption

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Cited by 8 publications
(6 citation statements)
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“…127 (3) Surface Band Bending Reversible changes in band bending at surfaces of conducting oxide are the basis for the chemical sensors 49,102 and have been studied for decades. [128][129][130] Recently, Lany et al demonstrated a surface accumulation layer at In 2 O 3 surfaces, induced by the reduced formation enthalpy of oxygen vacancies at the surface. 131 The accumulation layer was invoked to explain controversial observations of high electrical conductivity in nominally undoped In 2 O 3 .…”
Section: Surface Propertiesmentioning
confidence: 99%
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“…127 (3) Surface Band Bending Reversible changes in band bending at surfaces of conducting oxide are the basis for the chemical sensors 49,102 and have been studied for decades. [128][129][130] Recently, Lany et al demonstrated a surface accumulation layer at In 2 O 3 surfaces, induced by the reduced formation enthalpy of oxygen vacancies at the surface. 131 The accumulation layer was invoked to explain controversial observations of high electrical conductivity in nominally undoped In 2 O 3 .…”
Section: Surface Propertiesmentioning
confidence: 99%
“…Reversible changes in band bending at surfaces of conducting oxide are the basis for the chemical sensors and have been studied for decades . Recently, Lany et al .…”
Section: Surface Propertiesmentioning
confidence: 99%
“…The strong deviation of the observed 1/3 surface charge reduction from the ideal value of 1/4 is explained by the authors by, presumably, partial compensation of the ionic charge of Zn cations by hydrogen adsorbed on top of double Zn rows forming hydrides. On the O face, LEED, 4,7,8 lowenergy ion scattering (LEIS), 9 GIXD, 10−12 and surface X-ray diffraction 10 again showed an unreconstructed (1 × 1) structure, whereas a (1 × 3) (0001̅ ) reconstruction with O vacancies lying in the [100] direction was observed using HAS and LEED. 1,20 The O face reconstruction was supported by an X-ray photoelectron spectroscopy (XPS) quantitative analysis of the O 1s intensities, where a deficiency of 39 ± 10% of the topmost O ions was found.…”
Section: ■ Introductionmentioning
confidence: 99%
“…However, due to the lattice mismatch between ZnO and Si, many defects appear at the ZnO/Si interface and the ZnO surface. These surface states cause Fermi-level pinning in the middle of the band gap, significantly influencing the properties of ZnO Schottky diodes [14], [15]. Therefore, many surface-treatment techniques have been proposed to modify the ZnO surface, such as oxygen plasma [8], [10] and hydrogen peroxide treatment [11], [12].…”
Section: Introductionmentioning
confidence: 99%