Vertical and lateral drift corrections of scanning probe microscopy images

Rahe, Philipp; Bechstein, Ralf; Kühnle, Angelika

doi:10.1116/1.3360909

Cited by 75 publications

(80 citation statements)

References 28 publications

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“…C 60 forms a hexagonally-ordered monolayer on the calcite surface (Figure 1 b). In drift-corrected [22] atomic-force microscopy (AFM) images, we measured the distance between adjacent C 60 molecules, revealing the well-known C 60 ÀC 60 packing distance of 1 nm, in excellent agreement with previously determined values on calcite, [21] alkali halides, [23] and in bulk C 60 . [24] Besides the .…”

supporting

confidence: 52%

“…[25] In sharp contrast to the large-scale observations, the molecular-scale details change significantly upon irradiation, as shown in Figure 2 (further images are presented in the Supporting Information, Figure S1a, b). A monolayer of C 60 was exposed to a total number of (2.2 AE 0.4) 10 22 photons cm À2 (Figure 2 b). The most prominent change concerns the aperiodic moirØ pattern, clearly indicating that the C 60 islands no longer form a perfect periodic superstructure.…”

Section: Methodsmentioning

confidence: 99%

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Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite

et al. 2014

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A substrate-guided photochemical reaction of C60 fullerenes on calcite, a bulk insulator, investigated by non-contact atomic force microscopy is presented. The success of the covalent linkage is evident from a shortening of the intermolecular distances, which is clearly expressed by the disappearance of the moiré pattern. Furthermore, UV/Vis spectroscopy and mass spectrometry measurements carried out on thick films demonstrate the ability of our setup for initiating the photoinduced reaction. The irradiation of C60 results in well-oriented covalently linked domains. The orientation of these domains is dictated by the lattice dimensions of the underlying calcite substrate. Using the lattice mismatch to deliberately steer the direction of the chemical reaction is expected to constitute a general design principle for on-surface synthesis. This work thus provides a strategy for controlled fabrication of oriented, covalent networks on bulk insulators.

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supporting

confidence: 52%

Section: Methodsmentioning

confidence: 99%

Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite

et al. 2014

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“…All STM images have been leveled via polynomial background subtraction. Where noted, images have been calibrated and corrected for drift using the well-known Cu(111)-C 60 -p(4 × 4) structure as a calibration standard and the multi-image linear lateral drift correction algorithm described by Rahe et al [21].…”

Section: Methodsmentioning

confidence: 99%

Copper phthalocyanine thin films on Cu(111): Sub-monolayer to multi-layer

Stock

Nogami

2015

Surface Science

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“…For this reason, factors (2)-(4) should be removed from the scanned image. 4,6,11,12,27,30,31 In this work, we propose a method to determine the tilting angle of a sample and the creep factor of the Z scanner using two scanned images obtained in two different slow scanning directions with no need for special tools. The real topographic image can then be reconstructed by eliminating the distortions caused by the tilting angle and the creep effect.…”

Section: Reconstruction Of a Real Topographic Imagementioning

confidence: 99%

Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy

Han

Chung

2011

Review of Scientific Instruments

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We analyzed the illusory slopes of scanned images caused by the creep of a Z scanner in an atomic force microscope (AFM) operated in constant-force mode. A method to reconstruct a real topographic image using two scanned images was also developed. In atomic force microscopy, scanned images are distorted by undesirable effects such as creep, hysteresis of the Z scanner, and sample tilt. In contrast to other undesirable effects, the illusory slope that appears in the slow scanning direction of an AFM scan is highly related to the creep effect of the Z scanner. In the controller for a Z scanner, a position-sensitive detector is utilized to maintain a user-defined set-point or force between a tip and a sample surface. This serves to eliminate undesirable effects. The position-sensitive detector that detects the deflection of the cantilever is used to precisely measure the topography of a sample. In the conventional constant-force mode of an atomic force microscope, the amplitude of a control signal is used to construct a scanned image. However, the control signal contains not only the topography data of the sample, but also undesirable effects. Consequently, the scanned image includes the illusory slope due to the creep effect of the Z scanner. In an automatic scanning process, which requires fast scanning and high repeatability, an atomic force microscope must scan the sample surface immediately after a fast approach operation has been completed. As such, the scanned image is badly distorted by a rapid change in the early stages of the creep effect. In this paper, a new method to obtain the tilt angle of a sample and the creep factor of the Z scanner using only two scanned images with no special tools is proposed. The two scanned images can be obtained by scanning the same area of a sample in two different slow scanning directions. We can then reconstruct a real topographic image based on the scanned image, in which both the creep effect of the Z scanner and the slope effect of the sample have been eliminated. The slope effect of the sample should be eliminated so as to avoid further distortion after removal of the creep effect. The creep effect can be removed from the scanned image using the proposed method, and a real topographic image can subsequently be efficiently reconstructed.

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Vertical and lateral drift corrections of scanning probe microscopy images

Cited by 75 publications

References 28 publications

Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite

Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite

Copper phthalocyanine thin films on Cu(111): Sub-monolayer to multi-layer

Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy

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Vertical and lateral drift corrections of scanning probe microscopy images

Cited by 75 publications

References 28 publications

Substrate Templating Guides the Photoinduced Reaction of C60 on Calcite

Substrate Templating Guides the Photoinduced Reaction of C60 on Calcite

Copper phthalocyanine thin films on Cu(111): Sub-monolayer to multi-layer

Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy

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Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite

Substrate Templating Guides the Photoinduced Reaction of C₆₀ on Calcite