1999
DOI: 10.1117/12.354576
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Very wide dynamic range SWIR sensors for very low background applications

Abstract: This paper describes a high performance 320 by 256 readout integrated circuit (ROIC) designed for P-on-N short wave infrared (SWIR) detectors including InGaAs and HgCdTe, which also has the ability to operate at low input current levels with N-on-P detectors. The ROIC/FPA will support a wide range of system requirements from very low background applications (nightglow) to daytime high illumination conditions. To accommodate the wide scene dynamic range requirements, two selectable integration capacitors are us… Show more

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Cited by 10 publications
(4 citation statements)
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“…Because FPA capability and performance is closely tied to the performance and capability of the ROIC, it is useful to review the specifications (Figure 1) of the ISC9809 ROIC. 3 This device was originally designed for use with InGaAs detectors and as such is also ideally suited for use with VisGaAs detectors. The ISC9809 is also one of several ROICs that interface to the Indigo Systems Phoenix camera allowing the FPA to be integrated into a complete camera system.…”
Section: Visgaas Fpa Overviewmentioning
confidence: 99%
“…Because FPA capability and performance is closely tied to the performance and capability of the ROIC, it is useful to review the specifications (Figure 1) of the ISC9809 ROIC. 3 This device was originally designed for use with InGaAs detectors and as such is also ideally suited for use with VisGaAs detectors. The ISC9809 is also one of several ROICs that interface to the Indigo Systems Phoenix camera allowing the FPA to be integrated into a complete camera system.…”
Section: Visgaas Fpa Overviewmentioning
confidence: 99%
“…These objectives are successfully accomplished by infrared detector components by combining multiple technologies, such as "HOT" operation, "Small" pixels, and "Digital" integration. The digital ROIC designers have proposed greater criteria because as the pixel pitch gets smaller and smaller ( ≤ 5μm), the detector operating temperature gets increasingly higher ( ≥ 150K) [51]. We can only fulfill these objectives by continually lowering the IC design line width and putting out advanced ADC architectures.…”
Section: Discussionmentioning
confidence: 99%
“…It becomes almost impossible for the signals being read out to corrupt the signals being integrated [12). This insulation is especially effective for wiring on the integration capacitor to save area in the layout.…”
Section: A Unit Cell Designmentioning
confidence: 99%