1996
DOI: 10.1541/ieejsmas.116.283
|View full text |Cite
|
Sign up to set email alerts
|

Vibrating Silicon Microgyroscope

Abstract: Summary electrostatic force, and angular rate is detected as capacitance change between the resonator and its substrate.Mechanical Q factors for the driving and detecting modes of the polysilicon resonator are 2,800 and 16,000, respectively, at pressures below 0.1Pa. The test device worked in a vacuum, and output intensity was decreased at high ambient pressures.A noise-equivalent rate of 2deg/s was obtained at 1Pa.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1998
1998
1999
1999

Publication Types

Select...
3
2

Relationship

1
4

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…One [12,13] uses vertical detection and the other [14] uses lateral detection. The structure of the former enables a high accuracy to be achieved, but it requires vacuum packaging to prevent air damping.…”
Section: Structural Designmentioning
confidence: 99%
“…One [12,13] uses vertical detection and the other [14] uses lateral detection. The structure of the former enables a high accuracy to be achieved, but it requires vacuum packaging to prevent air damping.…”
Section: Structural Designmentioning
confidence: 99%