2012
DOI: 10.1007/978-3-642-32436-9_10
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Visible and Infrared Image Registration Employing Line-Based Geometric Analysis

Abstract: Abstract. We present a new method to register a pair of visible (ViS) and infrared (IR) images. Unlike most of existing systems that align interest points of two images, we align lines derived from edge pixels, because the interest points extracted from both images are not always identical, but most major edges detected from one image do appear in another image. To solve feature matching problem, we emphasize the geometric structure alignment of features (lines), instead of descriptorbased individual feature m… Show more

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Cited by 11 publications
(4 citation statements)
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“…In order to better illustrate the performance of LMLG detector, we compared LMLG based registration method with the nine detectors and three other registration algorithms on a same dataset in visual and quantitative ways. The three other algorithms used for comparison are Hrkać's method based on corners and hausdorff distance [11], Han's method based on line-based geometric analysis [50] and Liu's method based on SIFT flow [51]. All of the three methods are representative feature-based methods for infrared-visible image registration.…”
Section: B Infrared-visible Image Registrationmentioning
confidence: 99%
“…In order to better illustrate the performance of LMLG detector, we compared LMLG based registration method with the nine detectors and three other registration algorithms on a same dataset in visual and quantitative ways. The three other algorithms used for comparison are Hrkać's method based on corners and hausdorff distance [11], Han's method based on line-based geometric analysis [50] and Liu's method based on SIFT flow [51]. All of the three methods are representative feature-based methods for infrared-visible image registration.…”
Section: B Infrared-visible Image Registrationmentioning
confidence: 99%
“…In contrast to global region-based methods, local feature-based methods utilize the extracted features to establish correspondence, and they are generally divided into two groups: typical features-based methods and structural features-based methods. In the first group, extracted typical features include edges [17], lines [18][19][20][21][22], contours [23], gradient distribution [15,24], and their variants [25][26][27][28]. Those methods above are robust in response to geometrical changes, occlusion, background clutter, and noise.…”
Section: Related Workmentioning
confidence: 99%
“…The metric k,k 2 denotes the Euclidean distance between the two lines, and the error for a line is bounded by a maximum value e m . More details about this procedure can be found in (Han et al, 2012).…”
Section: Line Matchingmentioning
confidence: 99%