2022
DOI: 10.1039/d2fd00062h
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Visualizing optically-induced strains by five-dimensional ultrafast electron microscopy

Abstract: Optically-induced nanoscale strain dynamics in nano-fabricated Si thin films are quantitatively visualized on the picosecond scale. A newly developed ultrafast five-dimensional convergent beam electron diffraction method is introduced.

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Cited by 10 publications
(5 citation statements)
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“…Ultrafast transmission electron microscopy (UTEM) 54 has shown a route to achieve this using high-coherence emitters employing low charge (∼1 electron per pulse on average) driven at high repetition rates (reaching hundreds of kHz to –MHz) and taking advantage of the highly optimized electron optics to achieve high spatial and angular resolution. 55–58 Remarkable progress in conventional UTEM technology is taking place with the integration of RF bunchers to reduce space charge broadening, analogous to accelerator-scale beamlines with potential of offering drastic improvements in signal-to-noise and experiment times.…”
Section: Examples Of Ued At Hiresmentioning
confidence: 99%
“…Ultrafast transmission electron microscopy (UTEM) 54 has shown a route to achieve this using high-coherence emitters employing low charge (∼1 electron per pulse on average) driven at high repetition rates (reaching hundreds of kHz to –MHz) and taking advantage of the highly optimized electron optics to achieve high spatial and angular resolution. 55–58 Remarkable progress in conventional UTEM technology is taking place with the integration of RF bunchers to reduce space charge broadening, analogous to accelerator-scale beamlines with potential of offering drastic improvements in signal-to-noise and experiment times.…”
Section: Examples Of Ued At Hiresmentioning
confidence: 99%
“…Analyzing massive five-dimensional data sets obtained by five-dimensional scanning transmission electron microscopy (A. Nakamura et al, 2022;T. Shimojima et al, 2023a;T.…”
Section: Projects Using the Softwarementioning
confidence: 99%
“…Those methods require a spatial resolution of a few nanometers, a time resolution of a few seconds, and the ability to measure the local structure of glass. A novel technique of 5-dimensional scanning transmission electron microscopy (5D-STEM) [17][18][19] that involves convergent electron beam diffraction (CBED) does qualify these requirements. 5D-STEM can measure the spatiotemporal distribution of CBED patterns, and these patterns can yield local information that is hard to retrieve in the conventional parallel-beam diffraction mode.…”
Section: Introductionmentioning
confidence: 99%