25th ACM/IEEE, Design Automation Conference.Proceedings 1988.
DOI: 10.1109/dac.1988.14728
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VLSI design synthesis with testability

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Cited by 25 publications
(3 citation statements)
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“…[4][5][6][7][8][9] However, fewer probabilistic methods were reported. For example, Devadas 10 used a simulated annealing approach to solve the simultaneous cost/resource constrained allocation of functional units, registers, and interconnects by improving one solution at a time.…”
Section: Related Workmentioning
confidence: 99%
“…[4][5][6][7][8][9] However, fewer probabilistic methods were reported. For example, Devadas 10 used a simulated annealing approach to solve the simultaneous cost/resource constrained allocation of functional units, registers, and interconnects by improving one solution at a time.…”
Section: Related Workmentioning
confidence: 99%
“…Highlevel data path synthesis is concerned with the automatic generation and allocation of registers, ALUs and buses. Many approaches to automated data path synthesis have been proposed in the literature [1][2][3][4][5][6][7][8][9][10][11][17][18][19][20][21][22]]. However, current high-level synthesis tools lack the capability to handle early architectural design exploration so that the quality of designs produced by an automatic synthesis tool is not completely adequate for production use in comparison to manual design.…”
Section: Introductionmentioning
confidence: 99%
“…Several approaches have been reported, varying from testability analysis [4,8,9,15] to testability method selecting [5,12,14,17,18,20,23]. A number of the proposed systems integrate DFT in a design in either a procedural fashion [3,10,21] or a knowledge-based one [1,2,6,7,11,13,16, 19,22]. However, these approaches have in common that they have at least one of the following disadvantages: operation at one design level, mostly the gate level, sometimes the RT level or the functional level.…”
Section: Motivation For Wagnermentioning
confidence: 99%