“…Several approaches have been reported, varying from testability analysis [4,8,9,15] to testability method selecting [5,12,14,17,18,20,23]. A number of the proposed systems integrate DFT in a design in either a procedural fashion [3,10,21] or a knowledge-based one [1,2,6,7,11,13,16, 19,22]. However, these approaches have in common that they have at least one of the following disadvantages: operation at one design level, mostly the gate level, sometimes the RT level or the functional level.…”