2000
DOI: 10.1016/s0924-4247(99)00254-x
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VLSI-NEMS chip for parallel AFM data storage

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Cited by 140 publications
(88 citation statements)
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References 9 publications
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“…An electrical and thermal simulation predicts operation of a single cantilever identical in design to the array cantilever of Despont et al 6 and is verified by electrical measurements. Figure 2 shows a scanning electron micrograph of the present cantilever.…”
Section: Atomic Force Microscope Cantilevers For Combined Thermomechamentioning
confidence: 67%
See 1 more Smart Citation
“…An electrical and thermal simulation predicts operation of a single cantilever identical in design to the array cantilever of Despont et al 6 and is verified by electrical measurements. Figure 2 shows a scanning electron micrograph of the present cantilever.…”
Section: Atomic Force Microscope Cantilevers For Combined Thermomechamentioning
confidence: 67%
“…4 Array operation of heater cantilevers allows higher data rates than a single cantilever configuration. We have recently fabricated a functional array of 32ϫ32 heater cantilevers 6,7 and report parallel writing and reading operation of this array in Ref. 7.…”
Section: Atomic Force Microscope Cantilevers For Combined Thermomechamentioning
confidence: 99%
“…One concern with scanning probe lithography is the serial nature of the process and low throughput. Two approaches are in progress to address these issues: automating the nanofabrication (66-70) and͞or using parallel probes (70)(71)(72)(73). Nanostructures of SAMs are sufficiently stable, at least 40 h without observable desorption in pure solvent and 8 h without observable exchange in thiol solutions (50).…”
Section: Precise Positioning Of Small Molecules and Proteins On Surfamentioning
confidence: 99%
“…The AFM has been used to measure forces during stretching of DNA strands (4) and rupture forces of single covalent bonds (5) and can be operated in liquids, which enables its use in biological applications (6-8). The AFM also can be used to perform surface manipulations such as lithographic fabrication of a transistor (9, 10) or AFM-based data storage (11,12).Commercially available AFM instruments are rather bulky and have a low throughput because of the serial nature of the involved scanning process and the limited scanning range, which renders the investigation of larger samples rather laborious. The detection of the cantilever deflection is done mostly by means of a laser, which is costly and makes the adjustment and cantilever exchange very time consuming, in particular, when operating in a vacuum environment.…”
mentioning
confidence: 99%
“…The AFM has been used to measure forces during stretching of DNA strands (4) and rupture forces of single covalent bonds (5) and can be operated in liquids, which enables its use in biological applications (6-8). The AFM also can be used to perform surface manipulations such as lithographic fabrication of a transistor (9, 10) or AFM-based data storage (11,12).…”
mentioning
confidence: 99%