VNA calibration

Rumiantsev, Andrej; Ridler, N M

doi:10.1109/mmm.2008.919925

Cited by 148 publications

(68 citation statements)

References 55 publications

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“…But that doesn't mean the pseudo-wave S matrices are unimportant. On the contrary, they are indispensable for microwave and millimeter-wave metrology, because some fundamental VNA calibration algorithms, such as thru-reflect-line (TRL) [4], [21], [73], are formulated using complex-referenced S matrices (not S P matrices) [4], [74], [75]. Like it or not, you get complex-referenced S parameters (referenced to the natural reference impedance) from measurements, at least in some situations, and you have no choice but to work with them.…”

Section: Definitions and Usesmentioning

confidence: 99%

Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —

Amakawa

2016

IEICE Trans. Electron.

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SUMMARYThe most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50 Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.

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Section: Definitions and Usesmentioning

confidence: 99%

Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —

Amakawa

2016

IEICE Trans. Electron.

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“…The vector network analyzer (VNA) is the workhorse in most microwave laboratories, and its calibration technique has been well-developed through several decades [1]. As is well-known, the purpose of VNA calibration is to determine systematic errors to allow for the error correction of a device under test (DUT) measurement [2].…”

Section: Introductionmentioning

confidence: 99%

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Zhao

Liu²,

Wang

et al. 2017

Applied Sciences

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This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.

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“…To achieve high precision, the calibration procedure should be implemented before the measurement [2,3]. For the n-port VNA with n+1 measurement channels, the general short-openload-thru (GSOLT) procedure is now widely used [4][5][6].…”

Section: Introductionmentioning

confidence: 99%

Influence of Solt Calibration Standards on Multiport Vna S-Parameter Measurements

Zhao¹,

Xiao²,

H³

2014

PIER

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Abstract-For the GSOLT calibration algorithm of n-port vector network analyzers (VNA), the sensitivity coefficients for the S-parameters of the n-port device under test (DUT) are developed as functions of the S-parameter deviations of SOLT standards. By introducing the generalized flow graph of the 3n-term error model, analytic formulas for the S-parameter deviations of the n-port DUT with respect to the error terms have been deduced. In addition, expressions for the deviations of the error terms in regard to the nonideal calibration elements are given by a series of matrix operations. Finally, the analytic expressions of the sensitivity coefficients are concluded, which can be used for establishing the type-B uncertainty budget for S-parameter measurements.

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VNA calibration

Cited by 148 publications

References 55 publications

Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —

Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Influence of Solt Calibration Standards on Multiport Vna S-Parameter Measurements

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