Voltage adjustable attenuation with low 1/f noise

Ferre-Pikal, E.S.; Walls, F.L.

doi:10.1109/freq.1998.717903

Cited by 2 publications

(1 citation statement)

References 4 publications

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“…For long pulses the minimum flicker shifts to a demodulation angle near 45° as a result of the smaller imbalance of +( and '( . Similar AM-PM correlations have been found in RF oscillators [45,46], diodes [47], and transistors [48], but to our knowledge, this is the first demonstration of AM-PM flicker correlation in photodiodes. While the origin of this correlation is not known, correlated AM-PM is consistent with the idea that a single baseband noise source will modulate both the amplitude and phase of a photonically generated microwave.…”

Section: Correlation Of Amplitude and Phase Flicker Noisesupporting

confidence: 83%

Reduction of Flicker Phase Noise in High-Speed Photodetectors Under Ultrashort Pulse Illumination

et al. 2021

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High-fidelity photodetection enables the transfer of the low noise inherent to optical oscillators to the microwave domain. However, when photodetecting optical signals of the highest timing stability, photodiode flicker (1/f) noise can dominate the resulting timing jitter at timescales longer than ~1 ms. With the goal of improving femtosecond-level timing fidelity when transferring from the optical to microwave domain, we vary the duty cycle of a train of optical pulses and show that the photodetector flicker phase noise on a photonically generated 1 GHz microwave signal can be reduced by ~10 dB under ultrashort pulse illumination, reaching as low as -140/f dBc/Hz. In addition, a strong correlation between amplitude and phase flicker noise is found, implying a single baseband noise source can modulate both quadratures of the microwave carrier. These findings expand the limits of the ultimate timing stability that can be transferred from optics to electronics.

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Section: Correlation Of Amplitude and Phase Flicker Noisesupporting

confidence: 83%

Reduction of Flicker Phase Noise in High-Speed Photodetectors Under Ultrashort Pulse Illumination

et al. 2021

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Evaluation of passive component short-term stability via use in low loop delay oscillators

Driscoll

Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the IEEE International Frequency Control Sym

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Measurement of the PM noise generated by passive components operated at HF carrier frequencies was reported by NIST at the 1998 Frequency Control Symposium [l]. The results were obtained using a two channel, cross-correlation measurement system. The results indicated that the flicker portion of short-term reactance fluctuations of inductors, capacitors, and varactor diodes could result in carrier signal spectral degradation, especially when the components were used in moderate and narrow bandwidth tuned circuits (i.e., bandpass filters.In this paper, the results of similar measurements made in the VHF range are reported. Determination of the short-term reactance stability of several types of inductors, capacitors, varactor and PIN diode-based attenuators and helical resonators has been made. The measurements were made by using these components in simple tuned circuits and multipole filters that are used as the frequencydetermining element in low loop delay oscillators. Using this method, the near-canier phase noise of the oscillator signal is poor enough as to be easily measured. Further, if the oscillator loop delay is known,

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Voltage adjustable attenuation with low 1/f noise

Cited by 2 publications

References 4 publications

Reduction of Flicker Phase Noise in High-Speed Photodetectors Under Ultrashort Pulse Illumination

Reduction of Flicker Phase Noise in High-Speed Photodetectors Under Ultrashort Pulse Illumination

Evaluation of passive component short-term stability via use in low loop delay oscillators

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