2020
DOI: 10.1039/d0ta10371c
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Voltage bias stress effects in metal halide perovskites are strongly dependent on morphology and ion migration pathways

Abstract: We determined how morphology, electronic and interfacial interactions affect perovskite PVs under voltage bias stress. Our findings provide insights into the discrepancies in the solar cell efficiencies observed across many different research groups.

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Cited by 12 publications
(42 citation statements)
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“…Ion diffusion inside MHPs is yet another typical challenge, especially for the mixed-anion perovskites, which may influence their compositional stability. Applying an electric field, which is unavoidable during the measurement, leads to bias stress and ion migration, , which can lead to ion segregation and accelerated degradation of mixed-anion perovskites, as well the appearance of lattice defects, ion accumulation, and perovskite/metal contact degradation. Contact degradation arising from halide ion migration can occur due to atomic migration of the metal or the formation of metal compounds with halide anions such as AgI .…”
Section: Experimental Methods and Challenges In Characterizing Thermo...mentioning
confidence: 99%
“…Ion diffusion inside MHPs is yet another typical challenge, especially for the mixed-anion perovskites, which may influence their compositional stability. Applying an electric field, which is unavoidable during the measurement, leads to bias stress and ion migration, , which can lead to ion segregation and accelerated degradation of mixed-anion perovskites, as well the appearance of lattice defects, ion accumulation, and perovskite/metal contact degradation. Contact degradation arising from halide ion migration can occur due to atomic migration of the metal or the formation of metal compounds with halide anions such as AgI .…”
Section: Experimental Methods and Challenges In Characterizing Thermo...mentioning
confidence: 99%
“…Modern materials have pressed the envelope of what is achievable by semiconducting and conducting materials. This has necessitated the ability to deconvolute the intrinsic morphological and electronic complexities in terms of ionic charge transport, where next to traditional electronic transport ions can also migrate under a bias. , Ionic charge transport within materials can present advantageous or deleterious effects depending on the desired application. , It has in these cases become crucial to identify ion migration effects within materials.…”
Section: Electronic Structure Overviewmentioning
confidence: 99%
“…Ionic charge transport can be investigated using voltage/current bias stress characterization methods. Application of a DC bias across a material creates a nonlinear transient effect typically in the form of an exponential decay or growth . This represents the migratory pattern of the ionic species, which upon saturation will exhibit an ohmic response.…”
Section: Electronic Structure Overviewmentioning
confidence: 99%
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