2011
DOI: 10.1007/978-1-4419-7560-7
|View full text |Cite
|
Sign up to set email alerts
|

Voltage Regulators for Next Generation Microprocessors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
11
0

Year Published

2013
2013
2020
2020

Publication Types

Select...
3
2
1

Relationship

0
6

Authors

Journals

citations
Cited by 16 publications
(11 citation statements)
references
References 0 publications
0
11
0
Order By: Relevance
“…In dc-dc conversion, the switching performance of the power MOSFET is a major contributor to power loss [32]. The MOSFET parameters that play an important role include…”
Section: Switching Performancementioning
confidence: 99%
“…In dc-dc conversion, the switching performance of the power MOSFET is a major contributor to power loss [32]. The MOSFET parameters that play an important role include…”
Section: Switching Performancementioning
confidence: 99%
“…If BV DSS of LS-FET is low enough, then V SW_MAX = BV DSS (remember that V SW ∼ V DS_LS-FET ). A detailed analysis of the avalanche occurring during LE is found in [13]. Similarly, as in a clamped inductive switching, as long as the avalanche persists, the current is discharged from the stray inductance through the LS-FET.…”
Section: Induced Avalanche Operationmentioning
confidence: 99%
“…Since TE and LE are asymmetric commutations, there is no reckoning of identical avalanche behaviour. Differently from LE, ultra-fast TE is a convoluted process with many variables involved [13]. A large V DS_HS-FET ringing is originated by the fact that HS-FET turn-off is faster than LS-FET C OSS discharge.…”
Section: Induced Avalanche Operationmentioning
confidence: 99%
“…The reverse recovery characteristics of the body diode are considered in [13]- [14]: the analysis of the spurious triggering pulse is divided into the capacitive and the inductive parts and then implemented one by one in [13], while [14] adopts the behavior model of power MOSFETs to simulate the effect of the gate bias and source inductance on the spurious triggering pulse. On the impact of the source inductance of the SyncFET, opinions differ: [9]- [11] advocate it helps reduce the pulse, while [12]- [14] hold the opposite opinion.…”
Section: Nomenclaturementioning
confidence: 99%