2022
DOI: 10.1007/s40843-022-2187-2
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Wafer-scale single-crystalline β-Ga2O3 thin film on SiC substrate by ion-cutting technique with hydrophilic wafer bonding at elevated temperatures

Abstract: Heterogeneous integration of β-Ga 2 O 3 on a highly thermal conductive SiC substrate is an efficient solution to solve its bottleneck of thermal dissipation for highpower electronics. In this work, a 2-inch high-quality (201) β-Ga 2 O 3 single-crystalline film was transferred to the 4H-SiC substrate via the ion-cutting technique with hydrophilic bonding at elevated temperatures. The evolution process of the surface blistering on the hydrogen-implanted β-Ga 2 O 3 together with the internal pressure in blisters … Show more

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Cited by 14 publications
(4 citation statements)
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“…Wafer bonding is a promising approach to avoid the problem of lattice constant mismatch between different materials. 11,12) Recently, many novel heterostructures, such as β-Ga 2 O 3 -on-SiC, 13) have been fabricated by wafer bonding technique. Actually, the technique of fabricating Si-on-SiC by employing wafer bonding has been proposed by many researchers.…”
Section: Introductionmentioning
confidence: 99%
“…Wafer bonding is a promising approach to avoid the problem of lattice constant mismatch between different materials. 11,12) Recently, many novel heterostructures, such as β-Ga 2 O 3 -on-SiC, 13) have been fabricated by wafer bonding technique. Actually, the technique of fabricating Si-on-SiC by employing wafer bonding has been proposed by many researchers.…”
Section: Introductionmentioning
confidence: 99%
“…The sliced thin film is then transferred onto a handle wafer via a wafer bonding pro-cess, as shown in Fig. 1 [4] . The exfoliated wafer-scale thin film maintains good crystallization quality similar to the donor bulk, and the remaining bulk can be recycled to lower the process cost.…”
mentioning
confidence: 99%
“…The utilization of these substrates with high thermal conductivity and good insulating properties has led to improved temperature-dependent ON-and OFF-state current performance in heterogeneous Ga 2 O 3 MOS-FETs compared to bulk devices. Experimental demonstra- [4] . Copyright 2021, with permission from IEEE.…”
mentioning
confidence: 99%
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