Wall charge evolution models and emission of exoelectrons from MgO thin film of ac-PDPs

Kim, Yong-Seog; Yoon, Sang‐Hoon; Yang, Heesun

doi:10.1063/1.3275869

Cited by 15 publications

(9 citation statements)

References 26 publications

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“…From the simple expectation, only holes, i.e., positive charges, are considered to exist on the positively charged surface. However, the positive charge of the MgO surface of the cathode side enhances exoelectron emission, revealing that electrons trapped in shallow energy levels coexist in depth 25,26) and/or in plane with holes on the positively charged MgO surface, as discussed in detail previously. 19) A large number of holes on the positively charged surface may enhance the recombination with trapped electrons, resulting in the release of residual energy in the form of exoelectron emission through Auger and/or photoionization processes.…”

Section: Resultssupporting

confidence: 59%

Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels

Yoshino¹,

Nagatomi²,

Morita³

et al. 2010

Jpn. J. Appl. Phys.

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Section: Resultssupporting

confidence: 59%

Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels

Yoshino¹,

Nagatomi²,

Morita³

et al. 2010

Jpn. J. Appl. Phys.

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“…Furthermore, the experimental result in [6] presents that the amount of electron emission is proportional to the electric field across electrodes. In designing the driving waveforms in Fig.…”

Section: Resultsmentioning

confidence: 99%

Study on the Addressing Characteristics of an ac PDP With Sc-Doped MgO-Protecting Layer

Kim

2013

IEEE Trans. Plasma Sci.

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In this paper, the addressing characteristics of an ac plasma display panel (PDP) with Sc-doped MgO-protecting layer are investigated. The characteristics of addressing voltage and temporal distribution of addressing discharge event in Sc-doped MgO panel are different from those in a conventional MgO panel. In particular, the characteristics depending on the operation temperature are changed drastically in Sc-doped MgO panel. The formative discharge time lag increases as the addressing pulse application time and operation temperature increase regardless of protecting layers. The statistical time lag shows the contrary trend compared to the formative discharge time lag except for the MgO when operated in room temperature. The variation of addressing voltage and temporal distribution of addressing discharge event in different protecting layers can be understood through the survey of previous research result on the exoelectron emission characteristics from protecting layers in an ac PDP. It is assumed that the emission of electrons from a protecting layer results in the decrease of wall voltage but increase of priming effect for the addressing discharge. Also, the possibility for the control of addressing characteristics is suggested by changing scan voltage level during address period. Index Terms-Addressing characteristics, plasma display panel, Sc-doped MgO-protecting layer, temporal distribution of addressing discharge event.

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“…The functional material layer for providing electron such as CEL is commonly employed to attain high‐speed and low‐voltage addressing. Priming effect induced by the exo‐electron emission from the functional material layer shortens address discharge delay . The use of priming effect by a priming pulse is effective method to shorten address discharge delay .…”

Section: Introductionmentioning

confidence: 99%

High‐speed and low‐voltage write addressing of plasma display panels by use of extremely weak discharge

Yoshita

Shiga

2013

J Soc Info Display

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Although the priming effect shortens address period and reduces address voltage, it is difficult to use the priming effect for the conventional write addressing method because the ramp reset pulses provide little priming effect. An extremely weak discharge for priming has been incorporated with write addressing method. The extremely weak discharge is generated by priming pulse applied just prior to the scan pulse. In the 4-in-diagonal test panel containing Ne + 10%Xe mixture gas, infrared emission intensity of the discharge is 900 times smaller than that of sustain discharge. Therefore, there is no degradation of dark room contrast ratio. Because the priming discharge generates a very small amount of charges, there is little reduction in the amount of wall charge accumulated during reset period. Namely, increase in address voltage can be avoided. Although the discharge intensity is extremely low, it provides sufficient priming particles for high-speed and low-voltage addressing. When priming pulse voltage is 70 V and width is 10 μs, the address discharge delay is reduced to less than half. When the scan voltage margin is 10 V, the data voltage is reduced to 17 V, which is 20 V lower than that of conventional method.

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Wall charge evolution models and emission of exoelectrons from MgO thin film of ac-PDPs

Cited by 15 publications

References 26 publications

Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels

Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels

Study on the Addressing Characteristics of an ac PDP With Sc-Doped MgO-Protecting Layer

High‐speed and low‐voltage write addressing of plasma display panels by use of extremely weak discharge

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